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Photoluhi Nescence of Inas/InAsPSb and InAs/Heterojunctions

Published online by Cambridge University Press:  25 February 2011

A.N. Baranov
Affiliation:
Physico-Technical Institute, Leningrad, U.S.S.R
M.S. Bresler
Affiliation:
Physico-Technical Institute, Leningrad, U.S.S.R
O.B. Gusev
Affiliation:
Physico-Technical Institute, Leningrad, U.S.S.R
K.D. Moiseev
Affiliation:
Physico-Technical Institute, Leningrad, U.S.S.R
V.V. Sherstnev
Affiliation:
Physico-Technical Institute, Leningrad, U.S.S.R
Yu. P. Yakovlev
Affiliation:
Physico-Technical Institute, Leningrad, U.S.S.R
I.N. Yassievich
Affiliation:
Theoretical Physics Institute, Minnesota University, Minneapolis, U.S.A.
A. F. Ioffe
Affiliation:
Physico-Technical Institute, Leningrad, U.S.S.R
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Abstract

Photol uminescence of p-P InAs/InAsPSb and InAs/InAl AsSb heterojunctions grown by LPE method was studied at liquid helium temperature. The recombination spectra contained a new broad band lying between the substrate and the layer lines which was identified as an emission from the interface. This line is characterized by a strong blue shift when the excitation intensity increases. The intensities of bulk and interface lines show an unusual dependence on the pumping power. On the basis of experimental findings the interface line is attributed to emission from electrons confined at the interface due to reflection of elecctrons moving above the barrier.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

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References

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