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The optical properties of a polished uranium surface and its epitaxial oxide, and the rate of oxide growth determined by spectrophotometry

Published online by Cambridge University Press:  26 February 2011

Wigbert J Siekhaus
Affiliation:
siekhaus1@llnl.gov, LLNL, CMS MSTD, 7000 East Avenue, L-352, Livermore, CA, 94550, United States, 925-422-6884, 925-424-4737
Art J Nelson
Affiliation:
nelson63@llnl.gov, LLNL, CMS MSTD, United States
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Abstract

Wide-band reflectrometry and ellipsometry have been used to determine the optical properties n and k of freshly polished uranium and of the epitaxial oxide layer, and also the rate of oxide growth in air. Results for uranium metal as well as for epitaxial oxide are compared with single wavelength ellipsometry literature values.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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References

REFERENCES

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48. The essential help of Mehdi Balooch of n&k Industries and of James Hilfiker of J. A. Woollam Co. is gratefully acknowledged.Google Scholar

REFERENCES

[1] Ritchie, A. G., Journal of Nuclear Materials, 120(2–3) 143153 (1984)Google Scholar
[2] Schoenes, J., Physics Reports-Review Section of Physics Letters 63(6) 301336 (1980)Google Scholar
[3] Schoenes, J., Journal of the Chemical Society-Faraday Transactions II 83 12051213 (1987)10.1039/f29878301205Google Scholar
[4] Caculitan, N. R., Siekhaus, W. J., in Actinides, Basic Science, Applications & Technology, Mater. Res. Soc. Symp. Proc. Fall 2005, Boston Google Scholar
[5] Forouhi, A. R. and Bloomer, I., Physical Review B 34(10), 70187026 (1986).10.1103/PhysRevB.34.7018Google Scholar
[6] Forouhi, A. R. and Bloomer, I. (1988), Physical Review B 38(3), 18651874 (1987)10.1103/PhysRevB.38.1865Google Scholar
[7] Powell, G. L., Y12, Tennessee, private communication, 2005 Google Scholar