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Optical and Electrical Characterization of Copper-and Chlorine-Doped Cadmium Zinc Telluride

Published online by Cambridge University Press:  10 February 2011

J. E. Toney ,
B. A. Brunett ,
T. E. Schlesinger ,
E. Cross ,
F. P. Doty  and
R. B. James
J. E. Toney
Affiliation:
Department of Physics
B. A. Brunett
Affiliation:
Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213
T. E. Schlesinger
Affiliation:
Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213
E. Cross
Affiliation:
Sandia National Laboratories, Livermore, CA 94550
F. P. Doty
Affiliation:
Digirad Corp., San Diego, CA 92121
R. B. James
Affiliation:
Sandia National Laboratories, Livermore, CA 94550
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Abstract

We have used low-temperature photoluminescence spectroscopy and photo-induced current transient spectroscopy to study the properties of copper-doped Cd1−xZnxTe with x=0.1 and chlorine-doped Cd1−xZnxTe with x=0.2, 0.35 and 0.5. The current-voltage characteristics and detector response were also measured. We observed variations in charge collection and resistivity in the Cu-doped samples which was correlated with variations in PICTS spectra. The Cl-doped material was found to have insufficient resistivity for detector operation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 487: Symposium I – Semiconductors for Room-Temperature Radiation II , 1997 , 59
Copyright
Copyright © Materials Research Society 1998

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References

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