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Noise Performance of High Fill Factor Pixel Architectures for Robust Large-Area Image Sensors using Amorphous Silicon Technology

Published online by Cambridge University Press:  01 February 2011

Jackson Lai ,
Yuri Vygranenko ,
Gregory Heiler ,
Nader Safavian ,
Denis Striakhilev ,
Arokia Nathan  and
Timothy Tredwell
Jackson Lai
Affiliation:
jlai@venus.uwaterloo.ca, University of Waterloo, Department of Electrical and Computer Engineering, 200 University Avenue West, Waterloo, N2L 3K1, Canada
Yuri Vygranenko
Affiliation:
yuriy@venus.uwaterloo.ca, University of Waterloo, Department of Electrical and Computer Engineering, 200 University Avenue West, Waterloo, N2L 3G1, Canada
Gregory Heiler
Affiliation:
gregory.heiler@kodak.com, Eastman Kodak Company, 1700 Dewey Avenue, Rochester, NY, 14650-1822, United States
Nader Safavian
Affiliation:
safavian@venus.uwaterloo.ca, University of Waterloo, Department of Electrical and Computer Engineering, 200 University Avenue West, Waterloo, N2L 3G1, Canada
Denis Striakhilev
Affiliation:
dastriak@venus.uwaterloo.ca, University of Waterloo, Department of Electrical and Computer Engineering, 200 University Avenue West, Waterloo, N2L 3G1, Canada
Arokia Nathan
Affiliation:
an299@cam.ac.uk, University College London, London Centre for Nanotechnology, London, WC1H OAH, United Kingdom
Timothy Tredwell
Affiliation:
timothy.tredwell@kodak.com, Eastman Kodak Company, 1700 Dewey Avenue, Rochester, NY, 14650-1822, United States
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Abstract

Large area digital imaging made possible by amorphous silicon thin-film transistor (a-Si TFT) technology, coupled with a-Si photo-sensors, provides an excellent readout platform to form an integrated medical image capture system. Major development challenges evolve around

optimization of pixel architecture for detector fill factor, signal propagation performance, and manufacturability, while suppressing noise stemming from pixel array and external electronics. This work analyzes a novel vertically integrated pixel design based on signal readout and noise performance, and compares with conventional co-planar and continuous detector architectures. In addition, the analysis will consider various substrate options including glass and robust substrates such as polymer and metal foil. Our evaluation have demonstrated state-of-the-art radiographic detector system with electronic noise under 2000 electrons at 150 µs frame time for an imaging arrays on robust substrate.

Keywords

sensorsemiconductingthin film
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 989: Symposium A – Amorphous and Polycrystalline Thin-Film Silicon Science and Technology-2007 , 2007 , 0989-A14-05
Copyright
Copyright © Materials Research Society 2007

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