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New Experimental Method to Precisely Examine the LUMO Levels of Organic Semiconductors and Application to the Fullerene Derivatives

Published online by Cambridge University Press:  18 March 2013

Hiroyuki Yoshida
Hiroyuki Yoshida*
Affiliation:
Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011, Japan. JST PRESTO, 4-1-8 Honcho Kawaguchi, Saitama 332-0012, Japan.
*
*E-mail: yoshida@e.kuicr.kyoto-u.ac.jp
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Abstract

Inverse-photoemission spectroscopy (IPES) in the near-ultraviolet range is a new tool for investigating the LUMO levels of organic materials. Previous IPES methods have had two serious weaknesses, i.e. low energy resolution and sample damage to organic materials. In the present method, on the other hand, the irradiation damage to the organic sample is significantly reduced by decreasing the kinetic energy of electrons below the damage threshold. The energy resolution of the instrument is improved by a factor of two to 0.3 eV by using multilayer band pass filters. Acceptor materials widely used in organic photovoltaic cells, C60 and phenyl-C61-butyric acid methyl ester (PC61BM), are measured with this new technique to determine the electron affinities.

Keywords

electronic structurephotoemissionphotovoltaic
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1493: Symposium E/H – Photovoltaic Technologies, Devices and Systems Based on Inorganic Materials, Small Organic Molecules and Hybrids , 2013 , pp. 295 - 301
Copyright
Copyright © Materials Research Society 2013 

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References

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