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Neutron Reflection Measurement of Near-Surface Structural Change in an Oil-Water-Surfactant System

Published online by Cambridge University Press:  22 February 2011

U. Jeng
Affiliation:
University of Rhode Island, Department of Physics, Kingston, RI 02881
L. Esibov
Affiliation:
University of Rhode Island, Department of Physics, Kingston, RI 02881
M. L. Crow
Affiliation:
University of Rhode Island, Department of Physics, Kingston, RI 02881
A. Steyerl
Affiliation:
University of Rhode Island, Department of Physics, Kingston, RI 02881
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Abstract

The interfacial characteristics of an oil-water-surfactant sample were studied using the thermal neutron reflectometer at the Rhode Island Nuclear Science Center (RINSC). The sample was a mixture of deuterated octane with H2O and non-ionic surfactant (C10E4), spread onto an H2O substrate. A mixture of low surfactant concentration was used so that it could demix into a lamellar oil-water structure, stabilized by a monolayer of surfactant intervening at each oil-water interface. The reflectivity data showed a clearly visible difference between 25.2° C and 30.2°C, indicating that the significant increase of interfacial tension between these two temperatures induced a structural transition.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1 Langevin, D., in Light Scattering by Liquid Surfaces and Complementary Techniques, edited by Langevin, D., (Marcel Dekker, Inc., New York, 1992), pp. 233 - 265.Google Scholar
2 Meunier, J., in Light Scattering by Liquid Surfaces and Complementary Techniques, edited by Langevin, D., (Marcel Dekker, Inc., New York, 1992), pp. 333 - 365.Google Scholar
3 McClain, B. R., Lee, D. D., Carvalho, B. L., Mochrie, S. G. J., Chen, S. H. and Litster, J. D., Phys. Rev. Lett. 72, 246(1994).Google Scholar
4 Lee, L. T., Langevin, D. and Farnoux, B., Phys. Rev. Lett. 67, 2678 (1991).Google Scholar
5 Sanyal, M. K., Sinha, S. K., Huang, K. G. and Ocko, B. M., Phys. Rev. Lett. 66, 628 (1991).Google Scholar
6 Lee, L. T., Langevin, D., Meunier, J., Wong, K. and Cabane, B., Prog. Colloid. Polym. Sci. 81, 209 (1990).Google Scholar
7 Kahlweit, M., Jen, J., and Busse, G., J. Chem. Phys. 97, 6917 (1992),.Google Scholar
8 Jeng, U., Quagliato, S. J., Iyengar, L. R., Crow, M. L., Malik, S. S. and Steyerl, A., in Neutron Optical Devices And Applications, edited by Majkrzak, C. F. and Wood, J. L., Proc. SPIE 1738, 346 (1992).Google Scholar
9 Ankner, J. F. and Majkrzak, C. F., in Neutron Optical Devices And Applications, edited by Majkrza, C. F.k and Wood, J. L., Proc. SPIE 1738, 260 (1992).Google Scholar
10 Kellay, H., Meunier, J., and Binks, B. P., Phys. Rev. Lett., 69, 1220 (1992).Google Scholar