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Nano-scale Investigation of Light Scattering at Randomly Textured Light Trapping Structures for Thin-film Silicon Solar Cells

Published online by Cambridge University Press:  01 February 2011

Karsten Bittkau ,
Thomas Beckers ,
Carsten Rockstuhl ,
Stephan Fahr ,
Falk Lederer  and
Reinhard Carius
Karsten Bittkau
Affiliation:
k.bittkau@fz-juelich.de, Forschungszentrum Jülich, Institut für Energieforschung, Leo-Brandt-Straße, Jülich, 52425, Germany
Thomas Beckers
Affiliation:
t.beckers@fz-juelich.de, Forschungszentrum Jülich, Institut für Energieforschung, Leo-Brandt-Straße, Jülich, 52425, Germany
Carsten Rockstuhl
Affiliation:
carsten.rockstuhl@uni-jena.de, Friedrich-Schiller-Universität Jena, Institut für Festkörpertheorie und -optik, Max-Wien-Platz 1, Jena, 07743, Germany
Stephan Fahr
Affiliation:
stephan.fahr@uni-jena.de, Friedrich-Schiller-Universität Jena, Institut für Festkörpertheorie und -optik, Max-Wien-Platz 1, Jena, 07743, Germany
Falk Lederer
Affiliation:
falk.lederer@uni-jena.de, Friedrich-Schiller-Universität Jena, Institut für Festkörpertheorie und -optik, Max-Wien-Platz 1, Jena, 07743, Germany
Reinhard Carius
Affiliation:
r.carius@fz-juelich.de, Forschungszentrum Jülich, Institut für Energieforschung, Leo-Brandt-Straße, Jülich, 52425, Germany
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Abstract

We report on nano-scale optical effects of amorphous silicon layer conformally deposited on randomly textured zinc oxide layers on glass substrates investigated by near-field scanning microscopy. Such textured layers are used in thin-film photovoltaic devices to enhance light trapping. Experimental results are compared to theoretical data, obtained from large scale finite-difference time-domain simulations. Light localization on the surface of the textured interface and a focusing of light by the structure further away are observed. The measurements are compared with simulations, which provide additional insight into the light intensity distribution inside the solar cell on a nm-scale. It will be shown how this information can be used to optimize light trapping in thin-film solar cells using an amorphous silicon solar cell as an example.

Keywords

photovoltaicscanning probe microscopy (SPM)thin film
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1101: Symposium KK – Light Management in Photovoltaic Devices–Theory and Practice , 2008 , 1101-KK04-02
Copyright
Copyright © Materials Research Society 2008

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