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MOCVD of HfO2 from Alkoxide and Alkylamide Precursors

Published online by Cambridge University Press:  11 February 2011

John L. Roberts
Affiliation:
Department of Chemistry, University of Liverpool, Liverpool, L69 3ZD, UK
Paul A. Williams
Affiliation:
Epichem Limited, Power Road, Bromborough, Wirral, Merseyside, CH62 3QF, UK
Anthony C. Jones
Affiliation:
Department of Chemistry, University of Liverpool, Liverpool, L69 3ZD, UK Epichem Limited, Power Road, Bromborough, Wirral, Merseyside, CH62 3QF, UK
Paul Marshall
Affiliation:
Department of Materials Science and Engineering, University of Liverpool, Liverpool, L69 3BX, UK
Paul R. Chalker
Affiliation:
Department of Materials Science and Engineering, University of Liverpool, Liverpool, L69 3BX, UK
Jamie F. Bickley
Affiliation:
Department of Chemistry, University of Liverpool, Liverpool, L69 3ZD, UK
Hywel O. Davies
Affiliation:
Epichem Limited, Power Road, Bromborough, Wirral, Merseyside, CH62 3QF, UK
Lesley M. Smith
Affiliation:
Epichem Limited, Power Road, Bromborough, Wirral, Merseyside, CH62 3QF, UK
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Abstract

The alkoxide and alkylamide complexes [Hf(mmp)4] and [Hf(NMe2)4] 2 are both promising precursors for the MOCVD of HfO2. A comparison has shown that [Hf(NMe2)4] 2 deposits oxide at lower temperatures and over a wider temperature range then [Hf(mmp)4].

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

1. Wilk, G.W., Wallace, R.M., Anthony, J.M., J. Appl. Phys., 89, 5243 (2001)Google Scholar
2. Smith, R.C., Ma, T., Hoilien, N., Tsung, L.Y., Bevan, M.J., Colombo, L., Roberts, J., Campbell, S.A., Gladfelter, W., Adv. Mater. Opt. Electron., 10, 105 (2000)Google Scholar
3. Powell, C.F. in Chemically Deposited Nonmetals, edited by Powell, C.F., Oxley, J.H., Blocher, J.M. (John Wiley and Sons Inc., New York, 1966), p. 343 - 420, and references thereafter.Google Scholar
4. Pulver, M., Wahl, G., Electrochem. Soc. Proc., 97–25, 960 (1997)Google Scholar
5. Balog, M., Schieber, M., Patai, S., Michman, M., J. Cryst. Growth, 17, 298 (1972)Google Scholar
6. Gallegos, J.J., Ward, T.L., Boyle, T.J., Rodriguez, M.A., Francisco, L.P., Chem. Vap. Deposition, 21 (2000)Google Scholar
7. Recent Developments in the MOCVD of Electronic Materials, edited by A.C. Jones, Adv. Mater. Opt. Electron., 10, (2000), and references therein.Google Scholar
8. Bradley, D.C., Mehrotra, R.C., Gaur, D.P. in Metal Alkoxides (Academic Press, New York, 1978), and references therein.Google Scholar
9. Powell, C.F. in Chemically Deposited Nonmetals, edited by Powell, C.F., Oxley, J.H., Blocher, J.M. (John Wiley and Sons Inc., New York, 1966), 343 Google Scholar
10. Bradley, D.C., Chem. Rev., 89, 1317 (1989)Google Scholar
11. Williams, P.A., Roberts, J.L., Jones, A.C., Chalker, P.R., Bickley, J.F., Steiner, A., Davies, H.O., Leedham, T.J., J. Mat. Chem., 12, 165 (2002)Google Scholar
12. Williams, P.A., Roberts, J.L., Jones, A.C., Chalker, P.R., Tobin, N.L, Bickley, J.F., Davies, H.O., Smith, L.M., Leedham, T.J., Chem. Vap. Deposition, 8, 1 (2002)Google Scholar
13. Bastiani, A., Battiston, G.A., Gerbasi, R., Porchia, M., Daolio, S., J. Phys. IV, 5 (C5), 525 (1995)Google Scholar
14. Ohshita, Y., Ogura, A., Hoshino, A., Hiiro, S., Machida, H., J. Cryst. Growth, 233, 292 (2001)Google Scholar
15. Ohshita, Y., Ogura, A., Hoshino, A., Hiiro, S., Suzuki, T., Machida, H., Thin Solid Films, 406, 215 (2002)Google Scholar
16. Chisholm, M.H., Hammond, C.E., Huffman, J.C., Polyhedron, 7, 2515 (1988)Google Scholar
17. Jones, A.C., Leedham, T.J., Wright, P.J., Crosbie, M.J., Lane, P.A., Williams, D.J., Fleeting, K.A., Otway, D.J., O'Brien, P., Chem. Vap. Deposition, 4, 46 (1998)Google Scholar
18. Balog, M., Schieber, M., Michman, M., Patai, S., J. Electrochem., Soc., 126, 1203 (1979)Google Scholar