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Microstructures in Y-Ba-Cu-O Thin Films Investigated by XAFS Techniques

Published online by Cambridge University Press:  26 February 2011

A. Krol
Affiliation:
Department of Physics,, State University of New York at Buffalo, Buffalo, NY 14260
Z. H. Ming
Affiliation:
Department of Physics,, State University of New York at Buffalo, Buffalo, NY 14260
C. S. Lin
Affiliation:
Department of Physics,, State University of New York at Buffalo, Buffalo, NY 14260
Y. L. Soo
Affiliation:
Department of Physics,, State University of New York at Buffalo, Buffalo, NY 14260
C. X. Gu
Affiliation:
Department of Physics,, State University of New York at Buffalo, Buffalo, NY 14260
Y. H. Kao
Affiliation:
Department of Physics,, State University of New York at Buffalo, Buffalo, NY 14260
E. Narumi
Affiliation:
Department of Physics,, State University of New York at Buffalo, Buffalo, NY 14260
D. T. Shaw
Affiliation:
New York State Institute on Superconductivity, State University of New York at Buffalo, Buffalo, NY 14260
G. C. Smith
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973
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Abstract

Superconducting films of YBa2Cu3O7−6 obtained by laser ablation on MgO and ZrO2 substrates were investigated by soft x-ray absorption fine structure technique (XAFS) at O K-edge. Local environment around oxygen atoms was probed and information on the distribution of the nearestneighbors was obtained. Much higher degree of local disorder than that in a bulk YBa2Cu3O7−δ sample was observed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

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