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Microstructures at the Interface Between a-Axis Oriented YBa2Cu3O7−x and NdGaO3(110) Substrate

Published online by Cambridge University Press:  26 February 2011

Hiromi Takahashi
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10–13, Shinonome 1-chome Koto-ku, Tokyo 135, Japan
Norio Homma
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10–13, Shinonome 1-chome Koto-ku, Tokyo 135, Japan
Satoru Okayama
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10–13, Shinonome 1-chome Koto-ku, Tokyo 135, Japan
Tadataka Morishita
Affiliation:
Superconductivity Research Laboratory, ISTEC, 10–13, Shinonome 1-chome Koto-ku, Tokyo 135, Japan
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Abstract

The interface between an a-axis oriented YBa2Cu3O7-x film and a NdGaO3(110) substrate has been investigated by cross-section transmission electron microscopy (TEM). The orientational relationship between the a-axis oriented film and substrate is YBa2Cu3O7-x[001] / NdGaO3[001]. This preferentially c-axis aligned direction of the YBa2Cu3O7-x film would be caused by a very small lattice mismatch (0.1%) between b(=a) lattice constant of YBa2Cu3O7-x and of the pseudo-cubic sub-lattices in NdGaO3 at a substrate temperature of 750°C. Two kinds of imperfections have been observed in the crystal lattice of YBa2Cu3O7-x near the interface; One is the deviation of YBa2Cu3O7-x [301] from NdGaO3 [111]. The other type is pair dislocations with a positive and negative Burgers vectors in the YBa2Cu3O7-x (103) planes. These two kinds of defects at the interface would be act to reduce the tensile stress within a distance of about l.lnm from the substrate interface.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

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