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Microstructure and Chemical Ordering in UHV-Deposited, Polycrystalline Coxpt1−x Alloy Films for Magneto-Optical Recording*

Published online by Cambridge University Press:  15 February 2011

R. F. C. Farrow
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120–6099;
D. Weller
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120–6099;
M. F. Toney
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120–6099;
T. A. Rabedeau
Affiliation:
Stanford Synchrotron Radiation Laboratory, Stanford CA 94305
J. E. Hurst
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120–6099;
G. R. Harp
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120–6099;
R. F. Marks
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120–6099;
R. H. Geiss
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120–6099;
H. Notarys
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120–6099;
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Abstract

We report magneto-optical recording with 62 dB CNR (carrier-to-noise ratio) at 488 nm for quadrilayer structures comprising polycrystalline CoxPt1-x (x = 0.28) alloy films deposited on ungrooved, silicon nitride -coated glass discs, held at 300°C, by UHV evaporation. The key parameter controlling magnetic anisotropy of the films is substrate temperature during deposition. Polycrystalline films grown on amorphous silicon nitride have a large coercivity and full perpendicular remanance when grown at 300°C. Synchrotron X-ray diffraction data for polycrystalline films grown at 300 and 600°C confirm the presence of short-range compositional order, to the CoPt3-L12 phase in both cases. Such ordering can introduce an anisotropy in the distribution of Co-Co pairs in the alloy and is a possible source of the magnetic anisotropy.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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Footnotes

*

This work was supported in part by ONR Contract N00014- 92-C-0084.

References

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