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Metallic Nano Particles Embedded in Sapphire

Published online by Cambridge University Press:  13 February 2015

A. Crespo-Sosa
Affiliation:
Instituto de Fisica, Universidad Nacional Autónoma de México, A.P. 20-364, 01000 México, D.F., Mexico.
P.E. Mota-Santiago
Affiliation:
Instituto de Fisica, Universidad Nacional Autónoma de México, A.P. 20-364, 01000 México, D.F., Mexico.
J.L. Jiménez-Hernández
Affiliation:
Instituto de Fisica, Universidad Nacional Autónoma de México, A.P. 20-364, 01000 México, D.F., Mexico.
H.G. Silva-Pereyra
Affiliation:
Instituto de Fisica, Universidad Nacional Autónoma de México, A.P. 20-364, 01000 México, D.F., Mexico.
E.V. García-Ramírez
Affiliation:
Instituto de Fisica, Universidad Nacional Autónoma de México, A.P. 20-364, 01000 México, D.F., Mexico.
O. Sánchez-Dena
Affiliation:
Instituto de Fisica, Universidad Nacional Autónoma de México, A.P. 20-364, 01000 México, D.F., Mexico.
J.A. Reyes-Esqueda
Affiliation:
Instituto de Fisica, Universidad Nacional Autónoma de México, A.P. 20-364, 01000 México, D.F., Mexico.
A. Oliver
Affiliation:
Instituto de Fisica, Universidad Nacional Autónoma de México, A.P. 20-364, 01000 México, D.F., Mexico.
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Abstract

Sapphire is best known for its hardness that makes it ideal for many mechanical and optical applications, but its resistance to radiation damage and its optical properties, combined with metallic nano-particles, make it promising for future opto-electronic and plasmonic devices. In this paper, we present an overview of our work on the fabrication of metallic nano-particles embedded in synthetic sapphire by means of ion implantation, thermal annealing and high energy ion irradiation. We show that we can have control over the amount and size of the nano particles formed inside the matrix by carefully choosing the parameters during the preparation process. Furthermore, we show that anisotropic nano particles can be obtained by an adequate high energy ion irradiation of the originally spherical nano particles. We also have studied the linear and non-linear optical properties of these nano-composites and have confirmed that they are large enough for future applications.

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Articles
Copyright
Copyright © Materials Research Society 2015 

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References

REFERENCES

Dobrovinskaya, E.R., Lytvynov, L.A. and Pishchik, V., Sapphire: Material, Manufacturing, Applications (Micro- and Opto-Electronic Materials, Structures, and Systems). (Springer.2009)Google Scholar
, R Jr Haglund. Materials Science and Engineering A, 253(1-2), 275283. (1998)Google Scholar
Stepanov, A. L and Khaibullin, I.B., Rev.Adv.Mater.Sci, 9, 109129. (2005).Google Scholar
Atwater, H.A., Scientific American, 5 (April 2007).Google Scholar
Zhou, L., Zhang, C., Yang, Y., Li, B., Zhang, L., Fu, Y. and Zhang, H., Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 267(1), 5862. (2009)CrossRefGoogle Scholar
D’Orléans, C., Stoquert, J., Estournès, C., Cerruti, C., Grob, J., Guille, J., Haas, F., Muller, D. and Richard-Plouet, M., Physical Review B, 67(22), 220101 (2003).CrossRefGoogle Scholar
Oliver, A., Reyes-Esqueda, J.A., Cheang-Wong, J.C., Román-Velázquez, C., Crespo-Sosa, A., Rodríguez-Fernández, L., Seman-Harutinian, J.A. and Noguez, C., Physical Review B, 74(24), 245425 (2006).CrossRefGoogle Scholar
Mota-Santiago, P.E., Crespo-Sosa, A., Jiménez-Hernández, J.L., Silva-Pereyra, H.G., Reyes-Esqueda, J.A., and Oliver, A., Applied Surface Science, 259, 574581 (2012). doi:10.1016/j.apsusc.2012.06.114 CrossRefGoogle Scholar
Peña-Rodríguez, O., Rodríguez-Fernández, L., Rodríguez-Iglesias, V., Kellermann, G., Crespo-Sosa, A., Cheang-Wong, J.C., Silva-Pereyra, H.G., Arenas-Alatorre, J. and Oliver, A., Applied Optics, 48(3), 566–72. (2009) RCrossRefGoogle Scholar
Peña-Rodríguez, O., González Pérez, P.P., and Pal, U., International Journal of Spectroscopy, 2011, 110. (2011)CrossRefGoogle Scholar
Sánchez-Dena, O., Mota-Santiago, P.E., Tamayo-Rivera, L., García-Ramírez, E.V., Crespo-Sosa, A., Oliver, A. and Reyes-Esqueda, J.A., Optical Materials Express, 4(1), 92. (2013)CrossRefGoogle Scholar
Mota-Santiago, P.E., Crespo-Sosa, A., Jiménez-Hernández, J.L., Sanchez-Dena, O., Fernández-Hernández, R.C., Reyes-Esqueda, J.A. and Oliver, A., In 22nd Congress of the International Commission for Optics: Light for the Development of the World(Vol. 8011, p. 80113V–80113V–10) (2011).Google Scholar
Wang, G.G., Han, J.C., Zhang, H.Y., Zhang, M.F., Zuo, H.B., Hu, Z.H. and He, X.D., 44(9), 9951000 (2009).CrossRefGoogle Scholar
Kabir, A., Meftah, A., Stoquert, J.P., Toulemonde, M., and Monnet, I, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 267(6), 957959 (2009).CrossRefGoogle Scholar
Rizza, G., Ramjauny, Y., Gacoin, T., Vieille, L. and Henry, S., Physical Review B, 76(24), 245414 (2007).CrossRefGoogle Scholar
Crespo-Sosa, A., Silva-Pereyra, H.G., Fuentes Morales, P. and Oliver, A., A. (to be published). (2014),Google Scholar
Awazu, K., Wang, X., Fujimaki, M., Tominaga, J., Aiba, H., Ohki, Y. and Komatsubara, T., Physical Review B, 78(5), 18. (2008)Google Scholar
Dufour, C., Khomenkov, V., Rizza, G. and Toulemonde, M., Journal of Physics D: Applied Physics, 45(6), 065302 (2012).CrossRefGoogle Scholar
Mota-Santiago, P.E., Crespo-Sosa, A., Jiménez-Hernández, J.L., Silva-Pereyra, H.G., Reyes-Esqueda, J.A. and Oliver, A., (to be published) (2014).Google Scholar