Hostname: page-component-788cddb947-t9bwh Total loading time: 0 Render date: 2024-10-19T08:47:13.218Z Has data issue: false hasContentIssue false

Mesostructured Silica Films with Metal Oxide Doped Pore Walls

Published online by Cambridge University Press:  17 March 2011

Joachim Koehler
Affiliation:
Institute of Inorganic Chemistry I, Ulm University, Ulm, 89081, Germany
Jun Cai
Affiliation:
Institute of Surface Chemistry and Catalysis, Ulm University, Ulm, 89081, Germany
Rolf Juergen Behm
Affiliation:
Institute of Surface Chemistry and Catalysis, Ulm University, Ulm, 89081, Germany
Nicola Huesing
Affiliation:
Institute of Inorganic Chemistry I, Ulm University, Ulm, 89081, Germany
Get access

Abstract

In this work, novel approaches towards mixed metal oxide mesostructured films by a combination of evaporation-induced self-assembly and sol-gel processing of deliberately designed precursor molecules (from single source precursors to metal-surfactant complexes) are reported. The focus lies on Ti-oxide doped silica films with in a wide range variable Ti to Si ratios. The ligand-assisted templating based on metal-coordinated surfactants allows a selective positioning of the metal species in the silica wall which is advantageous for many catalytic applications. For the synthesis of these metal doped silica films, a non-ionic polyether-based surfactant (Brij56) was simultaneously used as the structure-directing agent and ligand for the respective metal-alkoxide, such as titanium isopropoxide. These metal-coordinated surfactants were mixed with a prehydrolyzed silica-solution based on tetraethoxysilane and ethanol and spin- or dip coated. In the second approach, a single source precursor for network formation based on 3-acetyl-6-trimethoxysilylhexane-2-one that was coordinated to titanium isopropoxide was synthesized. This precursor was either used as network forming agent in the presence of tetraethoxysilane and a surfactant (Brij56) or in combination with the metal-coordinated surfactant to broaden the accessible range of the Si:Ti ratios. The final films were characterized by XRD, XPS, nitrogen porosimetry and TEM.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Garcia, C., Zhang, Y., DiSalvo, F., Wiesner, U., Angew. Chem. Int. Ed. 42, 1526 (2003).Google Scholar
2 Matsura, V., Guari, Y., Larionova, J., Guerin, C., Caneschi, A., Sangregorio, C., Lancelle-Beltran, E., Mehdi, A., Corriu, R.J.P., J. Mater. Chem. 14, 3026 (2004).Google Scholar
3 Tura, C., Coombs, N., Dag, Ö., Chem. Mater. 17, 573 (2005).Google Scholar
4 Lu, Y., Ganguli, R., Drewien, C.A., Anderson, M.T., Brinker, C.J., Gong, W., Guo, Y., Soyez, H., Dunn, B., Huang, M.H., Zink, J.I., Nature, 389, 364 (1997).Google Scholar
5 Supplit, R., Hüsing, N., Bertagnolli, H., Bauer, M., Kessler, V., Seisenbaeva, G.A., Bernstorff, S., Gross, S., J. Mater. Chem. 16, 4443 (2006).Google Scholar
6 Hüsing, N., Launay, B., Hofer, F., Kickelbick, G., J. Sol-Gel Sci. Technol. 26, 615 (2003).Google Scholar
7 Hüsing, N., Launay, B., Kickelbick, G., Gross, S., Armelao, L., Bottaro, G., Feth, M., Bertagnolli, H., Hofer, F., Kothleither, G., Appl. Catal. 254, 297 (2003).Google Scholar
8 Andrianainarivelo, M., Corriu, R., Leclercq, D., Mutin, P.H., Vioux, A., J. Mater. Chem. 6, 1665 (1996).Google Scholar
9 Puchberger, M., Rupp, W., Bauer, U., Schubert, U., New J. Chem. 28, 1289 (2004).Google Scholar
10 Matsura, V., Guari, Y., Larionova, J., Guérin, C., Caneschi, A., Sangregorio, C., Lancelle-Beltran, E., Mehdi, A., Corriu, R.J.P., J. Mater. Chem. 14, 3026 (2004).Google Scholar
11 Brinker, C.J., Lu, Y., Sellinger, A., Fan, H., Adv. Mater. 11, 579 (1999).Google Scholar