Hostname: page-component-848d4c4894-jbqgn Total loading time: 0 Render date: 2024-07-01T12:54:54.188Z Has data issue: false hasContentIssue false
  • English
  • Français

Local Environment Around Barium Atoms in the Superconductor Y-Ba-Cu-O

Published online by Cambridge University Press:  28 February 2011

A. Krol ,
F. Xu ,
L. Y. Jang ,
C. J. Sher ,
S. Spagna ,
J. Althoff  and
Y. H. Kao
A. Krol
Affiliation:
Department of Physics, State University of New York at Stony Brook Stony, Brook N. Y. 11794
F. Xu
Affiliation:
Department of Physics, State University of New York at Stony Brook Stony, Brook N. Y. 11794
L. Y. Jang
Affiliation:
Department of Physics, State University of New York at Stony Brook Stony, Brook N. Y. 11794
C. J. Sher
Affiliation:
Department of Physics, State University of New York at Stony Brook Stony, Brook N. Y. 11794
S. Spagna
Affiliation:
Department of Physics, State University of New York at Stony Brook Stony, Brook N. Y. 11794
J. Althoff
Affiliation:
Department of Physics, State University of New York at Stony Brook Stony, Brook N. Y. 11794
Y. H. Kao
Affiliation:
Department of Physics, State University of New York at Stony Brook Stony, Brook N. Y. 11794
Get access

Abstract

The local structure around Ba atoms in the compound superconductor Y-Ba-Cu-O has been studied by measuring the extended x-ray absorption fine structure (EXAFS) near the Ba K edge. This technique is used to investigate the changes in the short range order structure when the system is doped with impurities.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 99: Symposium AA – High-Temperature Superconductors , 1987 , 609
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Boyce, J. B., Bridges, F., Claeson, T., Howland, R. S., and Geballe, T. H., Phys. Rev. B36, 5251 (1987);Google Scholar
Oyanagl, H., Ihara, H., Matsubara, T., Matsushita, T., Hlrabayashi, M., Tokumoto, M., Murata, K., Terada, N., Senzaki, K., Yao, T., Iwasaki, H., and Kimura, Y., Jpn. J. Appl. Phys. 26, L1233 (1987); and references cited therein.Google Scholar
2. Ovshinsky, S. R., Young, R. T., Allred, D. D., DeMaggio, G., and Van der Leeden, G. A., Phys. Rev. Lett. 58, 2579 (1987);Google Scholar
Bhargava, R. N., Herko, S. P., and Osborne, V. N., Phys. Rev. Lett. 59, 1468 (1987).Google Scholar
3. Lee, P. A., Citrin, P. H., Eisenberger, P., and Kincaid, B. M., Rev. Mod. Phys. 53, 769 (1981);Google Scholar
Hayes, T. M. and Boyce, J. B., Solid State Phys. 37, 173 (1982).Google Scholar
4. Siegrist, T., Sunshine, S., Murphy, D. W., Cava, R. J., and Zahurak, S. M., Phys. Rev. B35, 7137 (1987);Google Scholar
Beno, M. A., Soderholm, L., Capone, D. W. II, Hinks, D. G., Jorgensen, J. D., Grace, J. D., Schuller, I. K., Segre, C. U., and Zhang, K., Appl. Phys. Lett. 51, 57 (1987).Google Scholar