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Irradiation-induced ordering in Pt-Cu alloy focusing on Pt7Cu

Published online by Cambridge University Press:  02 February 2015

T. Nagase
Affiliation:
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan. Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
Y. Seno
Affiliation:
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan.
H. Yasuda
Affiliation:
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan. Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
H. Mori
Affiliation:
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan.
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Abstract

The existence of Pt7Cu ordering phase (intermetallic compound) was investigated by ab initio calculations and high voltage electron microscopy (HVEM) focusing on irradiation-induced ordering. The Pt7Cu ordering phase (cF32, prototype Ca7Ge) was predicted at 0 K through density functional theory (DFT), and using cluster expansion (CE) method and grand canonical Monte Carlo (GCMC) simulation, the ordering temperature of fcc-based Pt7Cu ordering phase was estimated to be above room temperature. The formation of Pt7Cu ordering phase was confirmed by a short-time irradiation for 3.6×103 s at 600 K. MeV electron irradiation can reduce drastically the annealing time for the ordering in the Pt-Cu alloy system, indicating that the combination of the prediction by ab initio calculations and HVEM can offer the unique opportunity to investigate the existence of ordering phase in alloys.

Type
Articles
Copyright
Copyright © Materials Research Society 2015 

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References

REFERENCES

Chandler, B.D., Schabel, A.B., and Pignolet, L.H., J. Catal. 193, 186 (2000).CrossRefGoogle Scholar
Epron, F., Gauthard, F., and Barbier, J., Appl. Catal. A237, 253 (2002).CrossRefGoogle Scholar
Subramanian, P.R. and Laughlin, D.E., Phase Diagrams of Binary Copper Alloys, (ASM International, Ohio, 1993) p. 326.Google Scholar
Abe, T., Sundman, B., and Onodera, H., J. Phase. Equilib. Diffus. 27, 5 (2006).CrossRefGoogle Scholar
Lu, Z. W., Wei, S. H., Zunger, A., Frota-Pessoa, S., and Ferreira, L. G., Phys. Rev. B44, 512 (1991).CrossRefGoogle Scholar
Yuge, K., J. Phys. Condensed. Mater. 21, 415401 (2009).CrossRefGoogle Scholar
Nelson, L. J., Hart, Guc L. W., and Curtarolo, S., Phys. Rev. B85, 054203 (2013).Google Scholar
Miida, R. and Watanabe, D., J. Appl. Cryst. 7, 50 (1974).CrossRefGoogle Scholar
Schulson, E. M., J. of Nucl. Mater. 83, 239 (1979).CrossRefGoogle Scholar
Banerjee, S. and Urban, K., Phys. Stat. Sol. A81, 145 (1984).CrossRefGoogle Scholar
Banerjee, S., Urban, K., and Wikens, M., Acta. Metall. 32, 299 (1984).CrossRefGoogle Scholar
Reuter, K.B., Williams, D.B., and Goldstein, J.I., Metall. Trans. A20, 711 (1989).CrossRefGoogle Scholar
Van der Ven, A., Thomas, J., Xu, Q., Swoboda, B., and Morgan, D., Phys. Rev. B78, 104306 (2008).CrossRefGoogle Scholar
Van der Ven, A., Thomas, J., Xu, Q., and Bhattacharya, J., Math. Comput. Simul. 80, 1393 (2010).CrossRefGoogle Scholar
Hohenberg, P. and Kohn, W., Phys. Rev. 136, 864 (1964).CrossRefGoogle Scholar
Kresse, G. and Hafner, J., Phys. Rev. B47, 558 (1993).CrossRefGoogle Scholar
Kresse, G. and Hafner, J., Phys. Rev. B49, 1425 (1994).Google Scholar
Kresse, G. and Furthmulle, J., J. Comput. Mat. Sci. 6, 15 (1996).CrossRefGoogle Scholar
Kresse, G. and Furthmuller, J., Phys. Rev. B54, 11169 (1996).CrossRefGoogle Scholar
Kresse, G. and Joubert, D., Phys. Rev. B59, 1758 (1999).CrossRefGoogle Scholar
Perdew, J. P., Burke, K., and Ernzerhof, M., Phys. Rev. Lett. 77, 3865 (1996).CrossRefGoogle Scholar
Perdew, J. P., Burke, K., and Ernzerhof, M., Phys. Rev. Lett. 78, 1396 (1997).CrossRefGoogle Scholar
Takaoka, A., Ura, K., Mori, H., Katsuta, T., Matsui, I., and Hayashi, S., J. Electron Microsc. 46, 447 (1997).CrossRefGoogle Scholar
Seno, Y., Master's thesis, Osaka University (2013).Google Scholar