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Ion Beam Mixing of Titanium Overlayers with Hydroxyapatite Substrates

Published online by Cambridge University Press:  21 February 2011

Timothy E. Levine ,
Michael Nastasi ,
T. L. Alford ,
Carlos Suchicital ,
Stephen Russell ,
Karen Luptak ,
Vincent Pizziconi  and
James W. Mayer
Timothy E. Levine
Affiliation:
Cornell University, Department of Materials Sci. and Engineering, Ithaca, NY 14853
Michael Nastasi
Affiliation:
Los Alamos National Laboratory, Materials Sci. and Tech. Div., Los Alamos, NM 87545
T. L. Alford
Affiliation:
Arizona State University, Dept. of Chem., Bio, and Materials Eng., Tempe, AZ 85287
Carlos Suchicital
Affiliation:
Arizona State University, Dept. of Chem., Bio, and Materials Eng., Tempe, AZ 85287
Stephen Russell
Affiliation:
Arizona State University, Dept. of Chem., Bio, and Materials Eng., Tempe, AZ 85287
Karen Luptak
Affiliation:
Arizona State University, Dept. of Chem., Bio, and Materials Eng., Tempe, AZ 85287
Vincent Pizziconi
Affiliation:
Arizona State University, Dept. of Chem., Bio, and Materials Eng., Tempe, AZ 85287
James W. Mayer
Affiliation:
Arizona State University, Dept. of Chem., Bio, and Materials Eng., Tempe, AZ 85287
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Abstract

The mixing of titanium overlayers with hydroxyapatite (HA) substrates via ion irradiation has been demonstrated. Analysis via secondary ion mass spectroscopy (SIMS) indicates an interfacial broadening of titanium and calcium of the implanted sample compared to that of the unimplanted sample. Attendant to the observed ion beam mixing of titanium into the HA, the oxygen signal of the titanium overlayer increases as a result of ion irradiation. It is supposed that this change is evident of diffusion through the metal layer and possibly from titania formation at the free surface and perovskite formation at the film/substrate interface. This possibility is consistent with thermodynamic predictions. Additionally, the force required to separate the film from the substrate increased as a result of ion irradiation, validating the continued study of ion beam processing of Ti/HA systems towards the improvement of long term fixation of implant devices.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 356: Symposium B2 – Thin Films: Stresses and Mechanical Properties V , 1994 , 791
Copyright
Copyright © Materials Research Society 1995

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