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Interfacial Interaction Between Cr Thin Films and Oxide Glasses

Published online by Cambridge University Press:  10 February 2011

N. Jiang  and
J. Silcox
N. Jiang
Affiliation:
School of Applied and Engineering Physics and Cornell Center for Materials Research, Cornell University, Ithaca, NY 14853, njiang@ccmr.cornell.edu
J. Silcox
Affiliation:
School of Applied and Engineering Physics and Cornell Center for Materials Research, Cornell University, Ithaca, NY 14853, njiang@ccmr.cornell.edu
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Abstract

The interfacial interaction between Cr thin films and multi-component oxide glasses has been observed by means of high spatial resolution electron energy loss spectroscopy. Besides a partially oxidized Cr thin layer, a ∼5nm wide Cr diffusion layer is seen. Chromium oxidation at the interface results from the difference between the heats of oxide formation. Ion exchange between Cr2+ and alkaline earth ions then causes the formation of the diffusion layer. The electronic states of the Cr in this diffusion layer are different from that in the oxidized layer. Strong interaction between Cr and O in the diffusion layer suggests that such a layer could be responsible for the formation of a strong Cr/glass interface

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 589 , 1999 , 377
Copyright
Copyright © Materials Research Society 2001

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