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In-Situ TEM Phase Formation in Cold Rolled Aluminum-Nickel Multilayers

Published online by Cambridge University Press:  10 February 2011

H. Sieber
Affiliation:
University of Wisconsin - Madison, Department of Materials Science and Engineering, 1509 University Avenue, Madison, WI 53706, USA, heino@nucleus.msae.wisc.edu
J. H. Perepezko
Affiliation:
University of Wisconsin - Madison, Department of Materials Science and Engineering, 1509 University Avenue, Madison, WI 53706, USA, heino@nucleus.msae.wisc.edu
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Abstract

Multilayer samples of Nickel and Aluminum with an overall composition of Al-20Ni were prepared by cold rolling of elemental foils. The sample microstructures and phases were characterized by XRD, SEM and TEM/SAED, and the reactive phase formation was then examined by DSC measurements. XRD, SEM and TEM measurements show that the rolling procedure results in a decrease of the Al and Ni layer thicknesses (down to 100 nm in average) and a decrease of the grain size (down to less than 50 nm). No phase formation is observed during the cold rolling procedure. In isochronal DSC scans of the Al-Ni multilayers, the formation of the Al3Ni phase was found to be a two step reaction process due to 2-dimensional nucleation and lateral growth and a 3-dimensional phase thickening. While XRD measurements showed Al3Ni as the only phase that forms, more detailed TEM investigations of the samples after DSC treatment also showed a small amount of an amorphous Al-Ni phase, formed by a thermally activated solid state amorphization reaction (SSAR). In-situ TEM heating of the amorphous areas under the electron beam in the microscope yielded the crystallization of the amorphous phase to a B2 structure and a growth of the B2 grains up to 100 nm in size.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

[1] Colgan, E.G., Mat. Sci. Rep. 5, 44 (1990).Google Scholar
[2] Barmak, K., Michaelson, C., and Lucadamo, G., J. Mater. Res. 12, 133 (1997).Google Scholar
[3] Edelstein, A.S., Everett, R.K., Richardson, G.R., Qadri, S.B., Foley, J.C., and Perepezko, J.H., Mat. Sci. Eng. A195, 13 (1995).Google Scholar
[4] Michaelson, C., Lucadamo, G., and Barmak, K., J. Appl. Phys. 80, 6689 (1996).Google Scholar
[5] Cardellini, F., Mazzone, G. and Antisari, A.V., Acta mater. 44, 1511 (1996).Google Scholar
[6] Atzmon, M., Phys. Rev. Letter 64, 487 (1990).Google Scholar
[7] Schaeublin, R. and Gotthardt, R., Phil. Mag. A, 74, 593 (1996).Google Scholar
[8] Azaroff, L.V., Elements of X-ray Crystallography, McGray-Hill, Inc. (1968).Google Scholar
[9] Bassani, M.H. da Silva, Perepezko, J. H., Edelstein, A.S., and Everett, R.K., Scripta Mat. 37, 227 (1997).Google Scholar
[10] Ma, E., Thompson, C.V., and Clevenger, L.A., J. Appl. Phys. 69, 2211 (1991).Google Scholar
[11] Cardellini, F., Mazzone, G., Montone, A., and Antisari, A.V., Acta mater. 42, 2445 (1994).Google Scholar
[12] Barmak, K., Michaelson, C., Bormann, R., and Lucadamo, G., Mat. Res. Soc. Symp. Proc. 382 33 (1995).Google Scholar
[13] Sieber, H. and Perepezko, J., in preparation.Google Scholar
[14] Battezzati, L., Antonione, C., and Fracchia, F., Intermetallics 3, 67 (1995).Google Scholar