Hostname: page-component-8448b6f56d-42gr6 Total loading time: 0 Render date: 2024-04-19T01:43:58.500Z Has data issue: false hasContentIssue false

Informatics for Combinatorial Experiments: Accelerating Data Interpretation

Published online by Cambridge University Press:  26 February 2011

M. Stukowski
Affiliation:
Department of Materials Science and Engineering, Iowa State University, Ames, IA 50011, U.S.A.
C. Suh
Affiliation:
Department of Materials Science and Engineering, Iowa State University, Ames, IA 50011, U.S.A.
Krishna Rajan
Affiliation:
krajan@iastate.edu, Iowa State University, Materials Science and Engineering, HOOVER 2220S, AMES, IA, 50011, United States, 515-294-2670, 515-294-5444
P. D. Tall
Affiliation:
Department of Physics, Université Cheikh Anta Diop, Dakar, Sénégal
A. C. Beye
Affiliation:
Department of Mechanical and Aeronautical Engineering, Princeton University, Princeton, NJ 08544, U.S.A.
A. G. Ramirez
Affiliation:
Department of Mechanical Engineering, Yale University, New Haven, CT 06520, U.S.A.
W. O. Soboyejo
Affiliation:
Department of Mechanical and Aeronautical Engineering, Princeton University, Princeton, NJ 08544, U.S.A.
M. L. Benson
Affiliation:
Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, U.S.A.
P.K. Liaw
Affiliation:
Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, U.S.A.
Get access

Abstract

Combinatorial experiments provide a means of generating large amounts of experimental data; however that does not necessarily lead to high throughput interpretation of that data. In this paper we provide a brief summary of how one can use informatics techniques to accelerate data interpretation from high throughput experiments. We provide examples from high throughput nanoindentation and diffraction experiments.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Rajan, K., Suh, C., Rajagopalan, A., Li, X., Mat. Res. Soc. Symp. Proc., 700 (2002).Google Scholar
2. Suh, C. and Rajan, K., Appl. Surf. Sci., 223, 148 (2004).Google Scholar
3. Potyrailo, R. A., Wroczynski, R. J., Lemmon, J. P., Flanagan, W. P., Siclovan, O. P., J.Comb. Chem. 5, 8 (2003).Google Scholar
4. Tall, P. D., Coupeau, C., and Rabier, J., Scripta Mater. 49, 903908 (2003).Google Scholar
5. Benson, M. L., Saleh, T. A., Liaw, P. K., Choo, H., Wang, X.-L., Stoica, A. D., Daymond, M. R., Brown, D. W., Buchanan, R. A., and Klarstrom, D. L., Denver X-ray Conference 2004.Google Scholar
6. Jiang, L., Brooks, C. R., Liaw, P. K., Dunlap, J., Rawn, C. J., Peascoe, R. A., and Klarstrom, D. L., Met. Trans. A 35, 785 (2004).Google Scholar