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Influence of Cavity Q-factor on Near-Infrared Emitting Microcavity Organic Light Emitting Diodes

Published online by Cambridge University Press:  01 February 2011

C. H. Cheung ,
A. B. Djuriši ,
C. Y. Kwong ,
H. L. Tam ,
K. W. Cheah ,
Z. T. Liu ,
W. K. Chan  and
P. C. Chui
C. H. Cheung
Affiliation:
Dept. of Physics, The University of Hong Kong, Pokfulam Road, Hong Kong
A. B. Djuriši
Affiliation:
Dept. of Physics, The University of Hong Kong, Pokfulam Road, Hong Kong
C. Y. Kwong
Affiliation:
Dept. of Electrical & Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong, Hong Kong
H. L. Tam
Affiliation:
Dept. of Physics, Hong Kong Baptist University, Kowloon Tong, Hong Kong
K. W. Cheah
Affiliation:
Dept. of Physics, Hong Kong Baptist University, Kowloon Tong, Hong Kong
Z. T. Liu
Affiliation:
Dept. of Physics, The University of Hong Kong, Pokfulam Road, Hong Kong
W. K. Chan
Affiliation:
Dept. of Chemistry, The University of Hong Kong, Pokfulam Road, Hong Kong, Hong Kong
P. C. Chui
Affiliation:
Dept. of Electrical & Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong, Hong Kong
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Abstract

In this work, we fabricated near-infrared emitting MOLEDs with two organic layers. The hole transporting layer was N, N′ – di(naphthalene-1-yl) - N,N′- diphenylbenzidine (NPB), while tris(8-hydroxyquinoline) aluminum (Alq) was the emissive and electron transporting layer. The bilayer structure was sandwiched between two silver mirrors. In order to investigate the influence of cavity Q-factor to the emission spectra, devices with different thickness of bottom mirror (anode) were fabricated. The influence of the choice of the bottom mirror (anode) was also investigated, and the devices with copper anode were also fabricated. The devices were characterized by angular dependent electroluminescence, photoluminescence, and transmittance measurements. Possible origins of the observed phenomena are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 871: Symposium I – Organic Thin-Film Electronics , 2005 , I3.27
Copyright
Copyright © Materials Research Society 2005

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References

1 Braun, D. and Heeger, J., Appl. Phys. Lett. 58, 1982 (1991)Google Scholar
2 Tessler, N., Burns, S., Becker, H., and Friend, R. H., Appl. Phys. Lett., 70, 556 (1997)Google Scholar
3 Dodabalapur, A., Rothberg, L. J., Jordan, R. H., Miller, T. M., Slusher, R. E., and Philips, J. M., J. Appl. Phys., 80, 6954 (1996)Google Scholar
4 Jordan, R. H., Rothberg, L. J., Dodabalapur, A., and Slusher, R.E., Appl. Phys. Lett., 69, 1997 (1996)Google Scholar
5 Shiga, T., Fujikawa, H., and Taga, Y., J. Appl. Phys., 93, 19 (2003)Google Scholar
6 Djurišić, A. B., Kwong, C. Y., Cheung, C. H., Tam, H. L., Cheah, K. W., Liu, Z. T., Chan, W. K., Chui, P. C., Chem. Phys. Lett., 399, 446 (2004)Google Scholar
7 So, S. K., Choi, W. K., Leung, L. M. and Neyts, K., Appl. Phys. Lett., 74, 1939 (1999)Google Scholar
8 Lidzey, D.G., Bradley, D.D. C., Armitage, A., Walker, S., Skolnick, M. S., Science, 288, 1620 (2000)Google Scholar
9 Hu, C. Y., Zheng, H. Z., Zhang, J. D., Zhang, H., Yang, F. H., and Zeng, Y. P., Appl. Phys. Lett., 82, 665 (2003)Google Scholar
10 Tzolov, M., Brütting, W., Petrova-Koch, V., Mückl, A., Berleb, S., Gmeiner, J., Schwörer, M., Synth. Met. 119, 559(2001)Google Scholar
11 Aziz, A., Narasimhan, K. L., Synth. Met. 131, 71 (2002)Google Scholar