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In situ X-ray Scattering Study of the Formation of Au Nano Crystals During Thermal Annealing

Published online by Cambridge University Press:  01 February 2011

Do Young Noh ,
Ki-Hyun Ryu  and
Hyon Chol Kang
Do Young Noh
Affiliation:
dynoh@gist.ac.kr, Gwangju Institute of Science and Technology, Materials science and engineering, 1 Oryong dong, Buggu, Gwangju, 500-712, Korea, Republic of, 81 62 970 2311, 82 62 970 2304
Ki-Hyun Ryu
Affiliation:
khryu@gist.ac.kr, Gwangju Institute of Science and Technology, Materials Science and Engineering, 1 Oryong-dong, Bug-gu, Gwangju, 500-712, Korea, Republic of
Hyon Chol Kang
Affiliation:
kanghc@gist.ac.kr, Gwangju Institute of Science and Technology, Advanced Photonic Research Institute, 1 Oryong-dong, Bug-gu, Gwangju, 500-712, Korea, Republic of
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Abstract

The transformation of Au thin films grown on sapphire (0001) substrates into nano crystals during thermal annealing was investigated by in situ synchrotron x-ray scattering and ex situ atomic force microscopy (AFM). By monitoring the Au(111) Bragg reflection and the low Q reflectivity and comparing them with ex situ AFM images, we found that polygonal-shape holes were nucleated and grow initially. As the holes grow larger and contact each other, their boundary turns into Au nano crystals. The Au nano crystals have a well-defined (111) flat top surface and facets in the in-plane direction.

Keywords

nanostructurex-ray diffraction (XRD)Au
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1027: Symposium D – Materials in Transition–Insights from Synchrotron and Neutron Sources , 2007 , 1027-D07-04
Copyright
Copyright © Materials Research Society 2008

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