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Hydrogenated Amorphous Silicon / ZnO Shottky Heterojunction for Position Sensitive Detectors

Published online by Cambridge University Press:  17 March 2011

H. ǵuas
Affiliation:
Departamento de Ci̸ncia dos Materiais, Faculdade de Ci̸ncias e Tecnologia, Universidade Nova de Lisboa, 2825-114 Caparica –, PORTUGAL
P. Nunes
Affiliation:
Departamento de Ci̸ncia dos Materiais, Faculdade de Ci̸ncias e Tecnologia, Universidade Nova de Lisboa, 2825-114 Caparica –, PORTUGAL
E. Fortunato
Affiliation:
Departamento de Ci̸ncia dos Materiais, Faculdade de Ci̸ncias e Tecnologia, Universidade Nova de Lisboa, 2825-114 Caparica –, PORTUGAL
R. Silva
Affiliation:
Departamento de Ci̸ncia dos Materiais, Faculdade de Ci̸ncias e Tecnologia, Universidade Nova de Lisboa, 2825-114 Caparica –, PORTUGAL
V. Silva
Affiliation:
Departamento de Ci̸ncia dos Materiais, Faculdade de Ci̸ncias e Tecnologia, Universidade Nova de Lisboa, 2825-114 Caparica –, PORTUGAL
J. Figueiredo
Affiliation:
Departamento de Ci̸ncia dos Materiais, Faculdade de Ci̸ncias e Tecnologia, Universidade Nova de Lisboa, 2825-114 Caparica –, PORTUGAL
F. Soares
Affiliation:
Departamento de Ci̸ncia dos Materiais, Faculdade de Ci̸ncias e Tecnologia, Universidade Nova de Lisboa, 2825-114 Caparica –, PORTUGAL
R. Martins
Affiliation:
Departamento de Ci̸ncia dos Materiais, Faculdade de Ci̸ncias e Tecnologia, Universidade Nova de Lisboa, 2825-114 Caparica –, PORTUGAL
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Abstract

In this work a new structure is proposed for position sensitive detectors consisting of glass/Cr/a-Si:H(n+)/a-Si:H(i)/ZnO, where the ZnO forms an heterojunction with the a-Si:H(i). The results show that this structure works with success in the fabrication of linear position sensitive detectors. The devices present a good nonlinearity of ͌ 2% and a good sensitivity tothe light intensity. The main advantages of this structure over the classical p-i-n are an easier to built topology and a higher yield due to a better immunity to the a-Si:H pinholes, since the ZnO does not diffuse so easily into a-Si:H as the metal does, which are the cause of frequent failure in the p-i-n devices due to short-circuits caused by the deposition of the metal over the a-Si:H. In this structure the illumination is made directly on the ZnO, so a transparent substrate is not needed and a larger range of substrates can be used.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

[1] Martins, R. and Fortunato, E.: Thin film position sensitive detectors: from 1D to 3D applications in The Technology and Applications of Amorphous Silicon, ed. by Street, R., Springer Verlage, p. 342 (1999).Google Scholar
[2] Fortunato, E., Soares, F., Lavareda, G., and Martins, R.: Mat. Res. Soc. Symp. Proc. 377, 797 ((1995).Google Scholar
[3] Fortunato, E., Teodoro, P., Silva, V., Ferreira, I., Nunes, Y., Guimarães, N., Soares, F., Giuliani, F., Popovic, G., Brener, W. and R. Martins. Phil. Mag. B, 80(4),765 (2000).Google Scholar
[4] Arimoto, S., Yamamoto, H., Ohno, H., Hasegawa, H.: J. Appl. Phys. 57(10), 4778 (1985).Google Scholar
[5] Fortunato, E., Ferreira, I., Giuliani, F., Wurmsdobler, P., R. Martins. J. of Non-Cryst. Solids, 266–269, 1213 (2000).Google Scholar
[6] Yamamoto, Y., Futako, W., Fukutani, K., Sugawara, M., Kamiya, T., Fortmann, C. M., I. Shimizu, Mat. Res. Soc. Symp. Proc. 507, 199 (1998).Google Scholar
[7] Aguas, H., Martins, R., Nunes, Y., Maneira, M., E. Fortunato: Influence of the Plasma Regime on the Structural, Optical, Electrical and Morphological Properties of a-Si:H Thin Films, Dusty and Colloidal plasmas in Solid State Phenom. (2001) in print.Google Scholar
[8] Nunes, P., Costa, D., Fortunato, E., R. Martins: Vacuum (2001), in print.Google Scholar
[3] Fortunato, E. and R. Martins. Rev. Scientific Instruments, 67(8), 2702 (1996).Google Scholar
[10] Fortunato, E., Lavareda, G., Martins, R., F. Soares and L. Fernandes. Sensors & Actuators A 51, 135 (1996).Google Scholar
[11] Forouhi, A.R. and Bloomer, I., Phys. Rev.B, 34, 7018 (1986).Google Scholar
[12] Jellison, G.E. and Modine, F.A., Appl. Physic. Letters, 69(3), 371 (1996).Google Scholar
[13] Fortunato, E., Nunes, P., Marques, A., Costa, D., ǵuas, H., Ferreira, I., Costa, M., R Martins:Highly conductive/transparent ZnO:Al thin film deposited at room temperature by r.f. magnetron sputtering, to be published in Materials Forum (2000).Google Scholar
[13] Layadi, Nacer, Croissance de couches minces de silicium amorphe et microcristalline préparées par méthodes plasma et traitement laser, Ph.D. these (1995), Ecole Polytechnique de Paris.Google Scholar
[15] Edwards, I., Sensors (December 1988).Google Scholar