Hostname: page-component-8448b6f56d-c4f8m Total loading time: 0 Render date: 2024-04-20T04:22:36.115Z Has data issue: false hasContentIssue false

Hreels Study of the Adsorption of Organometallics on GaAs(001) Surfaces

Published online by Cambridge University Press:  16 February 2011

A. Närmann
Affiliation:
IBM Research Division, T. J. Watson Research Center, Yorktown Heights, NY
R. J. Purtell
Affiliation:
IBM Research Division, T. J. Watson Research Center, Yorktown Heights, NY
M. L. Yu
Affiliation:
IBM Research Division, T. J. Watson Research Center, Yorktown Heights, NY
Get access

Abstract

Trimethylgallium (TMGa), Triethylgallium (TEGa) and Diethylgalliumchloride (DEGaCl) are used in combination with arsine (AsH3) in atomic layer epitaxy of GaAs. We simulated this process in a UHV system by dosing a c(2×8) or (1×6) reconstructed GaAs(001) surface with arsine and organometallics at different temperatures. After the surface reconstruction was verfied by LEED, the sample was transferred in situ to the HREELS (high resolution electron energy loss spectroscopy) chamber. We present new studies on the adsorption and pyrolysis of organometallics on GaAs(001) surfaces.

As a result we find that TMGa adsorbs molecularly on an As-rich cooled surface but decomposes upon adsorption on a Ga-stabilized (1×6) surface. These two adsorption states are identified by the geometrical position of the Gamethyl compound on the surface (Ga-C bond parallel or normal to the surface). The removal of the adsorbed species occurs on an As-rich surface at temperatures higher than 450°C and on the Ga-stabilized surface at 350°C.

For TEGa and DEGaCl we found similar results.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Ibach, H. and Mills, D. L., Electron Energy Loss Spectroscopy,(Academic Press, New York, 1982).Google Scholar
2. Förster, A. and Lüth, H., J. Vac. Sci. Technol., B7,720(1989).CrossRefGoogle Scholar
3. Lüth, H., J. Vac. Sci. Technol.,A7,696(1989).CrossRefGoogle Scholar
4. Lee, F. et al., Mat. Res. Soc. Symp. Proc.,131,339(1989).CrossRefGoogle Scholar
5. Lee, F. et al., Surf. Sci.,216,173(1989).CrossRefGoogle Scholar
6. Lee, F., Gow, T. R., and Masel, R. I.,J. Electrochem. Soc., 136,2640(1989).CrossRefGoogle Scholar
7. Memmert, U. and Yu, M. L., Appl. Phys. Lett.,56,1883(1990).CrossRefGoogle Scholar
8. Donnelly, V. M. and McCaulley, J. A., Surf. Sci.,238, 34(1990).Google Scholar
9. Creighton, J. R. et al., Appl. Phys. Lett.,57,279(1990).CrossRefGoogle Scholar
10. Murrell, A. J. et al.,J. Appl. Phys.,68,4053(1990).CrossRefGoogle Scholar