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High-Voltage Electron Microscopy Investigation of Subgrain Boundaries in Recrystallized Silicon-On-Insulator Structures
Published online by Cambridge University Press: 25 February 2011
Abstract
The microstructure of high-quality recrystallized Si films on SiO2 substrates produced by CO2 laser induced zone-melting has been investigated by high voltage electron microscopy (HVEM). Subgrain boundaries represent the major defects in these recrystallized films. The origin of the subboundaries has been traced to periodic internal stress concentrations occurring at the faceted growth interface. These highly localized stresses cause plastic deformation of the growing single crystal film by nucleation of an array of slip dislocations. The mechanism responsible for the formation of subgrain boundaries has been revealed to be polygonization, where thermally activated dislocations rearrange themselves into the lower energy configuration of the low angle grain boundary.
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- Copyright © Materials Research Society 1985
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