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Grain Boundaries in NiO†

Published online by Cambridge University Press:  25 February 2011

Karl L. Merkle ,
J. F. Reddy  and
C. L. Wiley
Karl L. Merkle
Affiliation:
Materials Science and Technology Division, Argonne National Laboratory, Argonne, IL 60539
J. F. Reddy
Affiliation:
Materials Science and Technology Division, Argonne National Laboratory, Argonne, IL 60539
C. L. Wiley
Affiliation:
Materials Science and Technology Division, Argonne National Laboratory, Argonne, IL 60539
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Abstract

Defocus-imaging and high-resolution electron microscopy (HREM) are used to study tilt grain boundaries (GB) in NiO near the <001> axis over the whole range of possible misorientation. Faceting and structural periodicities within facets are observed in high- and low-angle GBs. A reduced atomic density at high-angle GBs is suggested by the defocus behavior.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 41: Symposium K – Advanced Photon and Particle Techniques for the Characterization of Defects in Solids , 1984 , 213
Copyright
Copyright © Materials Research Society 1985

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Footnotes

†

Work supported by the U.S. Department of Energy.

References

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