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Flux Line Dynamics with Electron Holography

Published online by Cambridge University Press:  21 February 2011

Akira Tonomura
Akira Tonomura*
Affiliation:
Advanced Research Laboratory, Hitachi, Ltd. & Tonomura Electron Wavefront Project, ERATO, JRDC Hatoyama, Saitama 350-03, Japan
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Abstract

Flux lines in superconducting thin films are observed statically in a holographic electron interference micrograph, and dynamically in a Lorentz micrograph with a “coherent” and 300kV electron beam. In interference microscopy, projected magnetic lines of force in a tilted Nb thin film are observed quantitatively as contour fringes drawn on an in-focus electron micrograph. Whereas in Lorentz microscopy, flux lines are observed as spots with bright and dark contrast pairs due to defocusing of the image. Although the image is blurred due to a large amount of defocusing, this method is suitable for real-time observation. By making the best use of this feature, flux line movement can be observed when the applied magnetic field or the film temperature changes.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 332: Symposium U – Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy , 1994 , 55
Copyright
Copyright © Materials Research Society 1994

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References

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