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Examination of Interact Roughening in Ion Irradiated Cu/Nb Films by Computer Simulation and by X-Ray Diffraction

Published online by Cambridge University Press:  21 February 2011

P.J. Partyka ,
R.S. Averback ,
I.K. Robinson ,
Y.S. Lee ,
C.P. Flynn  and
P. Bellon
P.J. Partyka
Affiliation:
Materials Research Laboratory, University of Illinois, Urbana, IL 61801
R.S. Averback
Affiliation:
Materials Research Laboratory, University of Illinois, Urbana, IL 61801
I.K. Robinson
Affiliation:
Materials Research Laboratory, University of Illinois, Urbana, IL 61801
Y.S. Lee
Affiliation:
Materials Research Laboratory, University of Illinois, Urbana, IL 61801
C.P. Flynn
Affiliation:
Materials Research Laboratory, University of Illinois, Urbana, IL 61801
P. Bellon
Affiliation:
SRMP, Centre d'Etudes de Saclay, Gif-sur-Yvette, France
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Abstract

Interfacial roughening during ion irradiation of an immiscible system is investigated by Monte Carlo computer simulation and by an x-ray diffraction technique called crystal truncation rod (CTR) analysis. In the simulations, ion flux and sample temperature are varied, and the system is allowed to evolve under irradiation until it reaches a steady state behavior. The observed behaviors are then sought experimentally in the Cu/Nb system implanted with 2 MeV Kr+ ions at different sample temperatures. Analysis of the roughness at the Cu interface is based upon the existence of a crystal truncation rod, which contains information on exactly how the crystal is terminated, or, in other words, the interfacial roughness. Rutherford backscattering spectrometry (RBS) is also used to study the intermixing of the Cu and Nb layers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 396: Symposium A – Ion-Solid Interactions for Materials Modification and Processing , 1995 , 107
Copyright
Copyright © Materials Research Society 1996

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References

1 Bellon, P. and Partyka, P. J., submitted to Metastable Metal-Based Phases and Microstructures, edited by Mazzione, G., Shull, R. D., Averback, R.S., Bormann, R., and R.F. Ziolo (Mater. Res. Soc. Proc. 400, Pittsburgh, PA 1996)Google Scholar
2 Robinson, I.K., Phys. Rev. B, 33, 6, p. 3830–3836. (1986).Google Scholar