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Evaluation of Segregation in Polycrystalline 10 mol% Yttria Doped Zirconia (10YSZ)

Published online by Cambridge University Press:  20 September 2011

Muhammad Asri Idris ,
Janusz Nowotny  and
Sean S. Li
Muhammad Asri Idris
Affiliation:
School of Materials Science and Engineering, The University of New South Wales, Sydney, New South Wales, AUSTRALIA School of Materials Science and Engineering, University Malaysia Perlis, Kubang Gajah, Perlis, MALAYSIA
Janusz Nowotny
Affiliation:
Solar Energy Technologies, School of Natural Sciences, University of Western Sydney, Penrith South DC, New South Wales, AUSTRALIA
Sean S. Li
Affiliation:
School of Materials Science and Engineering, The University of New South Wales, Sydney, New South Wales, AUSTRALIA
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Abstract

The present work reports surface segregation in polycrystalline yttria-stabilised zirconia (cubic) including 10 mol% Y2O3 (10YSZ). The 10YSZ specimen was annealed in the range 1073 K - 1673 K in the gas phase of controlled oxygen activity. The segregation-induced intensity profiles of 89Y, 40Ca, 28Si, 27Al, 133Cs, 197Au and 90Zr was measured using secondary ion mass spectrometry (SIMS). The data obtained show that (i) annealing of 10YSZ results in the formation of segregation-induced concentration gradients of 89Y, 40Ca, 28Si, 27Al and (ii) segregation-induced profiles depend on oxygen activity.

Keywords

surface chemistrysecondary ion mass spectroscopy (SIMS)x-ray diffraction (XRD)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1363: Symposium RR – Fundamental Science of Defects and Microstructure in Advanced Materials for Energy , 2011 , mrss11-1363-rr05-07
Copyright
Copyright © Materials Research Society 2011

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