Hostname: page-component-77c89778f8-cnmwb Total loading time: 0 Render date: 2024-07-20T22:59:50.126Z Has data issue: false hasContentIssue false

Electron Microscopy and Diffraction of the Early Stages of Metal Heteroepitaxy

Published online by Cambridge University Press:  28 February 2011

E. Bauer*
Affiliation:
Physikalisches Institut, Technische Universität Clausthal, Leibnizstr. 4, D-3392 Clausthal-Zellerfeld, Federal Republic of Germany
Get access

Abstract

The application of some characterization methods to the study of heteroepitaxy is illustrated by recent work in the authors laboratory on the epitaxy of Cu on Mo and W(110). In particular, the use of PEEM and LEEM in the study of the epitaxy of Cu, Au and Co on Si(111) is discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Bauer, E., Jalochowski, M., Koziol, C. and Lilienkamp, G., MRS Int'l. Mtg. on Adv. Mats., Vol. 10 (Materials Research Society, 1989), p. 505.Google Scholar
2. Bauer, E. and Telieps, W., Scanning Microscopy Suppl. 1, 99 (1987); in Study of Surfaces and Interfaces by Electron Optical Techniques, edited by A. Howie and U. Valdrd (Plenum, New York, 1988), p. 195; E. Bauer in Chemistry and Physics of Solid Surfaces VIII, edited by R. Vanselow and R. Howe (Springer, Berlin, 1990).Google Scholar
3. Lilienkamp, G., Koziol, C. and Bauer, E., Surface Sci. 226, 358 (1990).Google Scholar
4. Tikhov, M. and Bauer, E., Surface Sci., in print.Google Scholar
5. Lilienkamp, G., Koziol, C. and Bauer, E., to be published.Google Scholar
6. Koshikawa, T., Hagen, T. v. d. and Bauer, E., Surface Sci. 109, 301 (1981).Google Scholar
7. Tikhov, M., Stolzenberg, M. and Bauer, E., Phys. Rev. B 36, 8719 (1987).Google Scholar
8. Mundschau, M., Bauer, E. and Swiech, W., Surface Sci. 203, 412 (1988); J. Appl. Phys. 65, 581 (1989).Google Scholar
9. Mundschau, M., Bauer, E. and Swiech, W., Catalysis Lett. 1, 405 (1988)Google Scholar
10. Mundschau, M., Bauer, E., Telieps, W. and Swiech, W., Surface Sci. 213, 381 (1989).Google Scholar
11. Bauer, E., Mundschau, M., Swiech, W. and Telieps, W., Ultramicroscopy 31, 49 (1989).Google Scholar
12. Mundschau, M., Bauer, E., Telieps, W. and Swiech, W., J. Appl. Phys. 65, 4747 (1989).Google Scholar