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Electron Beam Induced Two-State Noise in Carbon Nanotubes

Published online by Cambridge University Press:  31 January 2011

Jack Chan ,
Brian G. Burke ,
Chong Hu ,
Joe Campbell ,
Lloyd Harriott  and
Keith A. Williams
Jack Chan
Affiliation:
twc5x@virginia.edu, University of Virginia, Physics, Charlottesville, Virginia, United States
Brian G. Burke
Affiliation:
bgb9q@virginia.edu, University of Virginia, Physics, 382 McCormick Rd., Charlottesville, Virginia, 22904, United States
Chong Hu
Affiliation:
ch3tr@virginia.edu, University of Virginia, Electrical and Computer Engineering, Charlottesville, Virginia, United States
Joe Campbell
Affiliation:
jcc7s@virginia.edu, University of Virginia, Electrical and Computer Engineering, Charlottesville, Virginia, United States
Lloyd Harriott
Affiliation:
lrh8t@virginia.edu, University of Virginia, Electrical and Computer Engineering, Charlottesville, Virginia, United States
Keith A. Williams
Affiliation:
kwilliams@virginia.edu, University of Virginia, Physics, Charlottesville, Virginia, United States
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Abstract

Discrete current switching is induced in carbon nanotubes by electron beam irradiation. Switching amplitudes of 3% to 6% are observed at room temperature. Switching is created by electron beam exposure with dosage as low as 1000 pC/cm. Relative switching amplitude remains constant as the bias voltage varies, suggesting that current fluctuation is dominated by mobility fluctuation. Changes in the noise power spectral density following electron beam exposure will be discussed.

Keywords

electron irradiationdeviceselectrical properties
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1204: Symposium K – Nanotubes and Related Nanostructures-2009 , 2009 , 1204-K18-10
Copyright
Copyright © Materials Research Society 2010

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