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Electrical/Dielectric Properties of Nanocrystalline Cerium Oxide

Published online by Cambridge University Press:  10 February 2011

Jin-Ha Hwang ,
Thomas O. Mason  and
Edward J. Garboczi
Jin-Ha Hwang
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2225 N. Campus Dr., Evanston, IL 60208–3108
Thomas O. Mason*
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2225 N. Campus Dr., Evanston, IL 60208–3108
Edward J. Garboczi
Affiliation:
National Institute of Standards & Technology, Bldg. 226, Rm. B-350, Gaithersburg, MD 20899
*
† Author to whom correspondence should be addressed
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Abstract

Electrical/dielectric properties of nanocrystalline cerium oxide have been studied using impedance spectroscopy, thermopower, and DC 4-point conductivity. The combined techniques identified the effect of poor electroding on impedance spectra. Incomplete contact between the specimen and the electrode induces an additional arc in the impedance spectra. The additional high resistance feature results from the geometric constriction of current flow at the specimen/electrode interface and can be misinterpreted as a grain boundary response. The defect chemistry, nonstoichiometry, and transport properties were investigated in nanoscale ceria and compared with those of microcrystalline material.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 457: Symposium V – Nanophase and Nanocomposite Materials II , 1996 , 27
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

1. Lee, J., Hwang, J.-H., Mashek, J. J., Mason, T. O., Miller, A. E., and Siegel, R. W., J. Mater. Res., 10[9], 2295 (1995).Google Scholar
2. Chiang, Y. M., Lavik, E. B., Kosacki, I., Tuller, H. L. and Ying, J. Y., submitted to J. Electroceramics.Google Scholar
3. Hwang, J.-H., Ph.D. Dissertation, Northwestern University Evanston, IL, December, 1996.Google Scholar
4. Edwards, D. D., Hwang, J.-H., Ford, S. J., and Mason, T., Solid State Ionics, in press.Google Scholar
5. Boukamp, B. A.. EQUICVRT.PAS, Dept. of Chemial Technology, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands (1990).Google Scholar
6. Holm, R., in Electric Contacts: Theory and Application (Springer-Verlag, New York, 1967).Google Scholar
7. Hwang, J.-H. and Mason, T. O., to be submitted to J. Am. Ceram. Soc.Google Scholar
8. Tuller, H. L. and Nowick, A. S., J. Phys, Chem. Solids, 38, 859 (1977).Google Scholar
9. Bosman, A. J. and van Daal, H. J., Adv. Phys. 19[77], 1 (1970).Google Scholar