Hostname: page-component-76fb5796d-zzh7m Total loading time: 0 Render date: 2024-04-25T14:58:00.143Z Has data issue: false hasContentIssue false

Electrical Characterisation of a Low-Density Layer of SnO Nanowires Deposited on a Set of Parallel Pt Electrodes

Published online by Cambridge University Press:  01 February 2011

Ilia Kiselev
Affiliation:
ilia.kiselev@imt.fzk.de, Forschungszentrum Karlsruhe, Institute of Microstructure Technology, Hermann-von-Helmholtz-Platz 1, Karlsruhe, D-76344, Germany, +49-7247-82-3435, +49-7247-82-6667
Ilia Kiselev
Affiliation:
ilia.kiselev@imt.fzk.de , Forschungszentrum Karlsruhe, Institute of Microstructure Technology, Hermann-von-Helmholtz-Platz 1, Karlsruhe, D-76344, Germany
Victor Sysoev
Affiliation:
vsysoev@renet.com.ru, Saratov State Technical University, Physics Department, Polytechnicheskaya 77, Saratov, 410054, Russian Federation
Thomas Schneider
Affiliation:
Thomas.Schneider@imt.fzk.de, Forschungszentrum Karlsruhe, Institute of Microstructure Technology, Hermann-von-Helmholtz-Platz 1, Karlsruhe, D-76344, Germany
Get access

Abstract

Low-density layers of SnO2 nanowires were produced using the vapor solid method and dry-pressed onto surface-oxidized Si-substrates equipped with a set of 39 parallel Pt-electrodes. Current-Voltage (I-V) characteristics of the segments between the electrodes were measured in ambient air at a substrate temperature of 300°C. Statistical analysis of the 38 I-V characteristics allows drawing conclusions, that only Schottky contacts between large nanowires and electrodes are significant for conductometry, and that they have very similar barrier characteristics. The statistical approach and its advantages are demonstrated. The clarity obtained concerning the roles of different resistivity mechanisms involved enables predictions of the nanowire net device behavior in applications, which is demonstrated on an instance of long-term stability examination of gas sensor arrays.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Sysoev, V. V., Button, B. K., Wepsiec, K., Dmitriev, S. and Kolmakov, A., Nano Lett. 6, 1584 (2006).Google Scholar
2. Sysoev, V. V., Goschnick, J., Schneider, T., Strelcov, E. and Kolmakov, A., Nano Lett. 7, 3182 (2007).Google Scholar
3. Liu, J., Gao, P., Mai, W., Lao, C., Tummala, R. and Wang, Z. L., presented at the 2008 MRS Spring Meeting, San Francisco, CA, 2008.Google Scholar
4. Lilach, Y., Zhang, J.-P., Moskovits, M. and Kolmakov, A., Nano Lett. 5, 2019 (2005).Google Scholar
5. Goschnick, J., Microelec. Eng. 57-58, 693 (2001).Google Scholar