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Elecrically Detected Magnetic Resonance in A-SI:H Pin Cells

Published online by Cambridge University Press:  01 January 1993

Klaus Lips
Affiliation:
Fachbereich Physik und Wissenschaftliches Zentrum fur Materialwissenschaften, Universitat Marburg, Renthof 5, D-3550 Marburg, Germany
Walther Fuhs
Affiliation:
Fachbereich Physik und Wissenschaftliches Zentrum fur Materialwissenschaften, Universitat Marburg, Renthof 5, D-3550 Marburg, Germany
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Abstract

We report on a detailed study of EDMR in pin-type solar cells. Like in films the signals are dominated by the contribution of the e-db resonance. It is found that the spectra depend on the applied bias and photon energy of the exciting light. The data suggest that the dark current is controlled by recombination in the bulk of the i-layer. The sign of the signal depends sensitively on the sign of the internal field. At high forward bias and illumination recombination at the pi-interface plays an important role. Degradation by both light exposure and high forward current results predominantly from an increase of the bulk defect density.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Solomon, I., Biegelsen, D., and Knights, J.C., Solid State Comm. 22, 505 (1977)Google Scholar
2. Dersch, H., Schweitzer, L., and Stuke, J., Phys. Rev. B 28, 4678 (1983)Google Scholar
3. Brandt, M.S., and Stutzmann, M., Phys. Rev. B 43, 5184 (1991)Google Scholar
4. Lips, K., Schütte, S., and Fuhs, W., Phil. Mag. B 65, 945 (1992)Google Scholar
5. Movaghar, B., Ries, B., and Schweitzer, L., Phil. Mag. B 41, 159 (1980)Google Scholar
6. Homewood, K.P., Cavenett, B.C., Spear, W.E., and LeComber, P.G., J. Phys. C 16 L427 (1983)Google Scholar
7. Lips, K., and Fuhs, W., J. Non-Cryst. Sol. 137&138, 255 (1991)Google Scholar
8. Solomon, I., Solid State Comm. 20, 215 (1976)Google Scholar
9. Pfleiderer, H., J. Non-Cryst. Sol. 137&138, 1205 (1991)Google Scholar
10. Fortmann, C. M., Lange, S., Hicks, M., and Wronski, W.R., J. App. Phy. 64, 4219 (1988)Google Scholar
11. Redfield, D., and Bube, K.H., in Proc. of the 22nd IEEE PVSC 1991, 1319 Google Scholar
12. Kusian, W., and Pfleiderer, H., AIP Conf. Proc. Denver 1991, 290 Google Scholar