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Effect of Ta2O5 on Dielectric Properties of Forsterite Ceramics

Published online by Cambridge University Press:  01 February 2011

Dong-Young Kim
Affiliation:
Basic Research Lab., Electronics and Telecommunications Research Institute, 161 Gajeong-dong, Yuseong-gu, Daejeon, 305–350, Korea
Hong-Yeol Lee
Affiliation:
Basic Research Lab., Electronics and Telecommunications Research Institute, 161 Gajeong-dong, Yuseong-gu, Daejeon, 305–350, Korea
Dong-Suk Jun
Affiliation:
Basic Research Lab., Electronics and Telecommunications Research Institute, 161 Gajeong-dong, Yuseong-gu, Daejeon, 305–350, Korea
Sang-Seog Lee
Affiliation:
Basic Research Lab., Electronics and Telecommunications Research Institute, 161 Gajeong-dong, Yuseong-gu, Daejeon, 305–350, Korea
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Abstract

For the millimeter-wave dielectrics, forsterite-based ceramics were produced. Stoichiometric forsterite ceramics (Mg2SiO4) shows porous microstructure and very low Q*f values, which is not suitable for dielectrics in the microwave and millimeter-wave bands. The small addition (0.025 mol%) of Ta2O5 instead of SiO2 enhanced the sinterability of forsterite ceramics. The sintering temperature was reduced more than 150°C by the addition of Ta2O5. The density was greatly increased by Ta2O5 addition. The dielectric constant and Q*f of 0.025 mol% Ta2O5 modified forsterite sintered at 1500°C was 7.3 and 150, 000, respectively in microwave band (8–11GHz). The dielectric constant and Q*f of the same sample measured at 55GHz was 6.7 and 179, 000, respectively. Further addition of Ta2O5 decreases the sintering temperature.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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References

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