Hostname: page-component-8448b6f56d-gtxcr Total loading time: 0 Render date: 2024-04-23T10:41:48.314Z Has data issue: false hasContentIssue false
  • English
  • Français

Early Stages of Growth of BaTiO3 Thin-Films

Published online by Cambridge University Press:  16 February 2011

M. Grant Norton ,
Gerald R. English  and
C. Barry Carter
M. Grant Norton
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
Gerald R. English
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
C. Barry Carter
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
Get access

Abstract

Barium titanate (BaTiO3) is of interest for use in a number of thin-film applications in electronic and optoelectronic devices. For these devices the formation of epitactic films of the correct stoichiometry and phase is essential. The substrate is important during the early stages of growth in the establishment of epitaxy, factors such as lattice mismatch, surface preparation and crystallographic orientation can all affect film nucleation and growth. In this study thin-films of BaTiO3 have been formed using the pulsed-laser ablation technique. The early stages of film growth have been studied directly using transmission electron microscopy by examination of very thin films deposited onto specially prepared electron-transparent thin-foil substrates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 200: Symposium Y – Ferroelectric Thin Films I , 1990 , 237
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Okada, M., Takai, S., Amemiya, M. and Tominaga, K., Japn. J. Appl. Phys. 28, 1030 (1989).Google Scholar
2. Iijima, K., Tomita, Y., Takayama, R. and Ueda, I., J. Appl. Phys. 60, 361 (1986).Google Scholar
3. Davis, G.M. and Gower, M.C., Appl. Phys. Lett. 55, 112 (1989).Google Scholar
4. Norton, M.G., Summerfelt, S.R. and Carter, C.B., Appl. Phys. Lett. (in press).Google Scholar
5. Norton, M.G., Tietz, L.A., Summerfelt, S.R. and Carter, C.B., Appl. Phys. Lett. 55, 2348 (1989).Google Scholar
6. Hirsch, P.B., Howie, A., Nicholson, R.B., Pashley, D.W. and Whelan, M.J., Electron Microscopy of Thin Cstals, (Kreiger, Malabar, 1977) pp 357–365.Google Scholar