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Direct Observations of Grain Boundary Phenomena during Indentation of Al and Al-Mg Thin Films

Published online by Cambridge University Press:  01 February 2011

W. A. Soer
Affiliation:
Dept. of Applied Physics, Netherlands Institute for Metals Research, University of Groningen, Groningen, The Netherlands
J. Th. M. De Hosson
Affiliation:
Dept. of Applied Physics, Netherlands Institute for Metals Research, University of Groningen, Groningen, The Netherlands
A. M. Minor
Affiliation:
Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
E. A. Stach
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
J. W. Morris Jr
Affiliation:
Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA Dept. of Materials Science and Engineering, University of California, Berkeley, CA, USA
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Abstract

The deformation behavior of Al and Al-Mg thin films has been studied with the unique experimental approach of in-situ nanoindentation in a transmission electron microscope. This paper concentrates on the role of solute Mg additions in the transfer of plasticity across grain boundaries. The investigated Al alloys were deposited onto a Si substrate as thin films with a thickness of 200–300 nm and Mg concentrations of 0, 1.1, 1.8, 2.6 and 5.0 wt% Mg. The results show that in the Al-Mg alloys, the solutes effectively pin high-angle grain boundaries, while in pure Al considerable grain boundary motion is observed at room temperature. The mobility of low-angle grain boundaries is however not affected by the presence of Mg. In addition, Mg was observed to affect dislocation dynamics in the matrix.

Type
Research Article
Copyright
Copyright © Materials Research Society 2004

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References

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