Hostname: page-component-5c6d5d7d68-7tdvq Total loading time: 0 Render date: 2024-08-19T15:48:13.215Z Has data issue: false hasContentIssue false

Diffraction and Holography of Photoelectrons and Fluorescent X-Rays

Published online by Cambridge University Press:  15 February 2011

Charles S. Fadley*
Affiliation:
Department of Physics, University of California-Davis, Davis, CA 95616 Materials Sciences Division, Lawrence Berkeley Laboratory, Berkeley, CA 94720
Get access

Abstract

Photoelectron diffraction is by now a powerful technique for studying surface structures, with special capabilities for resolving chemical and magnetic states of atoms and deriving direct structural information from both forward scattering and backscattering. Fitting experiment to theory can lead to structural accuracies in the 0.03 Å range. Holographic inversions of such diffraction data also show considerable promise for deriving local three-dimensional structures around a given emitter with accuracies of 0.2-0.3 Å. Resolving the photoelectron spin in some way and using circularly polarized radiation for excitation provide added dimensions for the study of magnetic systems and chiral experimental geometries. Synchrotron radiation with the highest brightness and energy resolution, as well as variable polarization, is crucial to the full exploitation of these techniques. X-ray fluorescence holography also has promise for structural studies, but will require intense excitation sources and multichannel detection to be feasible.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] (a) Fadley, C.S., Phys. Scripts T17, 39 (1987); (b) in Synchrotron Radiation Research: Advances in Surface Science, edited by R.Z. Bachrach (Plenum, New York, 1992); (c) review to appear in Surface Science Reports.Google Scholar
[2] (a) Chambers, S.A., Vitomirov, I.M., Anderson, S.B., Chen, E.W., Wagner, T.J., and Weaver, J.E., Superlatt. and Microstruct. 3, 563 (1987); S.A. Chambers, Adv. in Phys. 40, 357 (1990); S.A. Chambers, Surf. Sci. Repts. 16, 261 (1992); (b) W.F. Egelhoff, Jr. in Critical Reviews in Solid State and Materials Sciences, 16, 213 (1990).CrossRefGoogle Scholar
[3] Bonsel, H.P., review to appear in Prog. in Surf. Sci.Google Scholar
[4] Szöke, A., in Short Wavelength Coherent Radiation: Generation and Applications, edited by Attwood, D.T. and Boker, J., AIP Conference Proceedings No. 147 (AIP, New York, 1986).Google Scholar
[5] (a) Barton, J.J., Phys. Rev. Lett. 61, 1356 (1988); (b) J.J. Barton, J. Electron Spectrosc. 51, 37 (1990).CrossRefGoogle Scholar
[6] (a) Li, C.H. and Tong, S.Y., Phys. Rev. Lett. 42, 901 (1979); (b) J.J. Barton and D.A. Shirley, Phys. Rev. B32, 1892 (1985); and Phys. Rev. B32, 1906 (1985); (c) A.P. Kaduwela, G.S. Herman, D.J. Friedman and C.S. Fadley, Phys. Scripta 41, 948 (1990); (d) A.P. Kaduwela, D.J. Friedman, and C.S. Fadley, J. Electron Spectrosc. 57, 223 (1991).Google Scholar
[7] Friedman, D.J. and Fadley, C.S., J. Electron Spectrosc. 51, 689 (1990).CrossRefGoogle Scholar
[8] Orders, P.J. and Fadley, C.S., Phys. Rev. B 27, 781 (1983); M. Sagurton, E.L. Bullock, and C.S. Fadley, Phys. Rev. 30, 7332 (1984).Google Scholar
[9] (a) Sebilleau, D., Desjonqueres, M.C., Chaveau, D., Guillot, C., Lecante, J., Treglia, G., and Spanjaard, D., Surf. Sci. Lett. 185, L527 (1987); (b) A. Nilsson, H. Tillborg, and N. Nirtensson, Phys. Rev. Lett. 67, 1015 (1991); (c) K.U. Weiss et al., Phys. Rev. Lett. 69, 3196 (1992); (d) J.D. Denlinger, E. Rotenberg, U. Hessinger, M. Leskovar, and M.A. Olmstead, J. Vac. Sci. Tech., to appear.Google Scholar
[10] Sinkovic, B., Hermsmeier, B.D., and Fadley, C.S., Phys. Rev. Lett. 55, 1227 (1985); B. Sinkovic, D.J. Friedman, and C.S. Fadley, J. Magn. Magn. Mater. 92, 301 (1991); B.D. Hermsmeier, J. Osterwalder, D.J. Friedman, and C.S. Fadley, Phys. Rev. Lett. 62, 478 (1989); B.D. Hermsmeier, J. Osterwalder, D.J. Friedman, B. Sinkovic, T.T. Tran, and C.S. Fadley, Phys. Rev. B 42, 11895 (1990).Google Scholar
[11] Hillebrecht, F.U., Jungblut, R., and Kisker, E., Phys. Rev. Lett. 65, 2450 (1990).CrossRefGoogle Scholar
[12] Terminello, L.J., Zhang, X.S., Huang, Z.Q., Kim, S., Schach von Wittenau, A.E., Leung, K.T., and Shirley, D.A., Phys. Rev. B 38, 3879 (1988); L.-Q. Wang, Z. Hussain, Z.Q. Huang, A.E. Schach von Wittenau, D.A. Shirley, and D.W. Lindle, Phys. Rev. B 44, 13771 (1991).CrossRefGoogle Scholar
[13] Fritzsche, V. and Woodruff, D.P., Phys. Rev. B 46, 16128 (1992).Google Scholar
[14] (a) Harp, G.R., Saldin, D.K., and Tonner, B.P., Phys. Rev. Lett. 65, 1012 (1990); G.R. Harp, D.K. Saldin, and B.P. Tonner, Phys. Rev. B42, 9199 (1990); (b) L.J. Terminello, J.J. Barton, and D.A. Lapiano-Smith, J. Vac. Sci. Technol. B10, 2088 (1992) and private communication.Google Scholar
[15] (a) Herman, G.S., Thevuthasan, S., Tran, T.T., Kim, Y.J., and Fadley, C.S., Phys. Rev. Lett. 68, 650 (1992); (b) S. Thevuthasan, G.S. Herman, A.P. Kaduwela, T.T. Tran, Y.J. Kim, R.S. Saiki, and C.S. Fadley, J. Vac. Sci. Technol. A10, 2261 (1992); (c) S. Thevuthasan, R.X. Ynzunza, E.D. Tober, C.S. Fadley, A.P. Kaduwela, and M.A. van Hove, Phy. Rev. Lett. 70, 595 (1993)Google Scholar
[16] (a) Zhou, Y., Chen, X., Campuzano, J.C., Saldin, D.K., and Ding, H., these proceedings; (b) B. Petersen, L. Terminello, J.J. Barton, and D.A. Shirley, these proceedings; (c) G.D. Waddill and J.G. Tobin, to be published.Google Scholar
[17] Wu, H., Lapeyre, G.J., Huang, H., and Tong, S.Y., to be published.Google Scholar
[18] (a) Thevuthasan, S., Herman, G.S., Kaduwela, A.P., Saiki, R.S., Kim, Y.J., Niemczura, W., Burger, M. and Fadley, C.S., Phys. Rev. Lett. 67, 469 (1991) (b) S. Thevuthasan, P.M. Len, and C.S. Fadley, to be published.Google Scholar
[19] Harp, G.R., Saldin, D.K., Chen, X., Han, Z.L., and Tonner, B.P., J. Electron Spectrosc. 258, 313 (1991).Google Scholar
[20] (a) Tonner, B.P., Han, Z.-L., Harp, G.R., and Saldin, D.K., Phys. Rev. B 43, 14423 (1991); D.K. Saldin, G.R. Harp, and B.P. Tonner, Phys. Rev. B45, 9629 (1992); (b) S.Y. Tong, C.M. Wei, T.C. Zhao, H. Huang, and H. Li, Phys. Rev. Lett. 66, 60 (1991).Google Scholar
[21] Saldin, D.K., Harp, G.R., Chen, B.L. and Tonner, B.P., Phys. Rev. B 44, 2480 (1992).Google Scholar
[22] Saiki, R.S., Kaduwela, A.P., Osterwalder, J., Friedman, D.J., Fadley, C.S., and Brundle, C.R., Surf. Sci. 279, 305 (1992).Google Scholar
[23] Tong, S.Y., Li, H., and Huang, H., Phys. Rev. Lett. 67, 3102 (1992); S.Y. Tong, H. Huang, and C.M. Wei, Phys. Rev. B46, 2452 (1992).Google Scholar
[24] (a) Bansmann, J., Ostertag, Ch., Schönhense, G., Fogel, F., Westphal, C., Getzlaff, M., Schafers, F., and Petersen, H., Phys. Rev. B 46, 13496 (1992); (b) A.P. Kaduwela, C. Westphal, K. Van Hove, and C.S. Fadley, to be published..Google Scholar
[25] (a) Baumgarten, G., Schneider, C.M., Petersen, H., Schafers, F., and Kirschner, J., Phys. Rev. Lett. 65, 492 (1990); (b) G.D. Waddill, J. Tobin, and D.R. Pappas, Phys. Rev. B46, (1992).CrossRefGoogle Scholar
[26] (a) Kaduwela, A.P., Wang, Z., Van Hove, M.A., and Fadley, C.S., to be published; (b) E.M.E. Timmermans, G.T. Trammell, and J.P. Hannon, to be published.Google Scholar
[27] Len, P.M., Thevuthasan, S., Fadley, C.S., Kaduwela, A.P., and Van Hove, M.A., to be published.Google Scholar