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Dielectric Properties of Electrostatic Self-Assembled (ESA) Films

Published online by Cambridge University Press:  01 February 2011

Ramazan Asmatulu ,
Brian Geist ,
William B. Spillman Jr  and
Richard O. Claus
Ramazan Asmatulu
Affiliation:
Virginia Tech Applied Biosciences Center, 106 Plantation Road, Virginia Polytechnic Institute and State University 0356, Blacksburg VA 24061
Brian Geist
Affiliation:
Virginia Tech Applied Biosciences Center, 106 Plantation Road, Virginia Polytechnic Institute and State University 0356, Blacksburg VA 24061
William B. Spillman Jr
Affiliation:
Virginia Tech Applied Biosciences Center, 106 Plantation Road, Virginia Polytechnic Institute and State University 0356, Blacksburg VA 24061
Richard O. Claus
Affiliation:
Virginia Tech Applied Biosciences Center, 106 Plantation Road, Virginia Polytechnic Institute and State University 0356, Blacksburg VA 24061
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Abstract

Capacitance measurements were conducted to determine the dielectric constant of electrostatic self assembly (ESA) films over various temperature and frequency ranges at 1 mV and 15% relative humidity. Measurement electrodes were fabricated on the ESA films using silver grease and a brass bar. In these tests, polymeric nanofilms were fabricated on gold-coated glass slides using the ESA process. Thicknesses of the films were between 100 nm and 600 nm obtained by depositing different number bilayers of negatively charged Poly s-119 (PS-119) or heparin and positively charged poly(diallyldimethylammonium chloride) (PDDA). The test results showed that dielectric constant values were around 2. Based on the test results, we concluded that this is a technique that might prove useful to estimate the capacitance and dielectric constant values of nanostructured ESA films, which can be largely used in the near future.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 871: Symposium I – Organic Thin-Film Electronics , 2005 , I9.2
Copyright
Copyright © Materials Research Society 2005

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