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Dielectric Measurements On Printed-Wiring And Circuit Boards, Thin Films, And Substrates: An Overview1

Published online by Cambridge University Press:  15 February 2011

James Baker-Jarvis
Affiliation:
Electromagnetic Fields Division, National Institute of Standards and Technology, MS 813.08, Boulder, CO 80303–3328
Chriss A. Jones
Affiliation:
Electromagnetic Fields Division, National Institute of Standards and Technology, MS 813.08, Boulder, CO 80303–3328
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Abstract

A review of the most common methods of permittivity measurements on thin films, printed-wiring and circuit boards, and substrates is presented. Transmission-line techniques, coaxial apertures, open resonators, surface-wave modes, and dielectric resonators methods are examined. The frequency range of applicability and typical uncertainties associated with the methods are summarized.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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Footnotes

1

U.S. Government work not protected by U.S. copyright

References

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