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The Dielectric Loss of Single Crystal and Polycrystalline TiO2

Published online by Cambridge University Press:  10 February 2011

Xiaoru Wang ,
Alan Templeton ,
Stuart J. Penn  and
Neil McN. Alford
Xiaoru Wang
Affiliation:
SEEIE, South Bank University, 103 Borough Road, London SEI 0AA
Alan Templeton
Affiliation:
SEEIE, South Bank University, 103 Borough Road, London SEI 0AA
Stuart J. Penn
Affiliation:
SEEIE, South Bank University, 103 Borough Road, London SEI 0AA
Neil McN. Alford
Affiliation:
SEEIE, South Bank University, 103 Borough Road, London SEI 0AA
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Abstract

The dielectric loss of single crystal and polycrystalline TiO2 has been studied. In polycrystalline TiO2 the dielectric loss is determined by both the microstructure and by the oxygen stoichiometry. Experiments have been carried out to determine the influence of both the microstructure (particularly porosity) and the oxygen stoichiometry. The TiO2 powder has been doped with partially stabilised zirconia, an oxygen ion conductor, in order to modify the oxygen stoichiometry. Sintered discs have been examined for loss as a function zirconia doping, pore volume and as a function of temperature. The behaviour of the doped and undoped titania powders is significantly different. Since many microwave dielectric materials contain Ti eg Ba-Ti-O, Ba-Nd-Ti-O, (Ba-RE-Ti-O, RE=Rare Earth), Zr-Sn-Ti-O etc it is essential to understand the role of the titanium, particularly as it can exist in mixed valence states, and the role of oxygen and its influence on the dielectric loss.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 500: Symposium EE – Electrically Based Microstructural Characterization II , 1997 , 183
Copyright
Copyright © Materials Research Society 1998

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References

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