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Characterization of Epitaxial Superconducting YBacuO Thin Films with Three Different Orientations

Published online by Cambridge University Press:  28 February 2011

X.K. Wang ,
D.X. Li ,
S.N. Song ,
J.Q. Zheng ,
R.P.H. Chang  and
J.B. Ketterson
X.K. Wang
Affiliation:
Materials Research Center and Science & Technology Center for Superconductivity, Northwestern University, Evanston, IL 60208
D.X. Li
Affiliation:
Materials Research Center and Science & Technology Center for Superconductivity, Northwestern University, Evanston, IL 60208
S.N. Song
Affiliation:
Materials Research Center and Science & Technology Center for Superconductivity, Northwestern University, Evanston, IL 60208
J.Q. Zheng
Affiliation:
Materials Research Center and Science & Technology Center for Superconductivity, Northwestern University, Evanston, IL 60208
R.P.H. Chang
Affiliation:
Materials Research Center and Science & Technology Center for Superconductivity, Northwestern University, Evanston, IL 60208
J.B. Ketterson
Affiliation:
Materials Research Center and Science & Technology Center for Superconductivity, Northwestern University, Evanston, IL 60208
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Abstract

Epitaxial thin films of YBaCuO were prepared by multilayer deposition from Y, Cu, and BaF2 sources with: (1) the a‐axis perpendicular to (100)SrTiO3; (2) the c‐axis perpendicular to (100)SrTiO3; and (3) the [110] axis perpendicular to (110)SrTiO3. XRD patterns as well as SEM and HREM images confirm that the films are highly oriented, essentially epitaxial. Both the a‐axis oriented and the c‐axis oriented films exhibit zero resistance at 91K. The [110] oriented film shows the sharpest transiton with a transition width of IK and zero resistance at 85K. The zero field critical current density, Jc, determined magnetically, is in excess of 107A/cm2 at 4.4K and 1.04 x 106A/cm2 at 77K for the c‐axis oriented film; for the a‐axis oriented film we obtained 6.7 x 106A/cm2 at 4.4K and 1.2 x 105A/cm2 at 77K. The orientation dependence of the critical current density in the basal plane of the a‐axis oriented film was studied. The largest Jc's occur along the in‐plane <100> axes of the substrate.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 679
Copyright
Copyright © Materials Research Society 1990

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References

1 Dinger, T.R., Worthington, T.K., Gallagher, W.J., and Sandstron, R.L., Phys. Rev. Lett, 58 2687 (1987).Google Scholar
2 LeGoues, F.K., Philos, Mag. B57 167 (1988).Google Scholar
3 Chauhari, P., LeGoues, F.K., Segmflller, A., Science 238 324 (1987).Google Scholar
4 Nakahara, S., Fisanick, G.J., Yan, M.F., van Dover, R.B., Boone, T., and Moore, R., J. Crystal Growth 85 639 (1987).Google Scholar
5 Salama, K., Selvamanickam, V., Gao, L., and Sun, K., Appl. Phys. Lett. 54 5 (1989).Google Scholar
6 Wang, X.K., Sheng, K.C., Lee, S.J., Shen, Y.H., Song, S.N., Li, D.X., Chang, R.P.H., and Ketterson, J.B., Appl. Phys. Lett. 54 1573 (1989).Google Scholar
7 Scheneemeyer, L.F., Waszczak, J.V., Siegrist, T., van Dover, R.B., Rupp, L.W., Batlogg, B., Cava, R.J., and Murphy, D.W., Nature 328, 601 (1987).Google Scholar
8 Li, D.X., Wang, X.K., Li, D.Q., Chang, R.P.H., and Ketterson, J.B., J. Appl. Phys., Nov. 15, 1989 in press.Google Scholar
9 Chaudhari, P., Koch, R.H., Laibowitz, R.B., McGuire, T.R., and Gambino, R.J., Phys. Rev. Lett. 58 2684 (1987).Google Scholar
10 Bean, C.P., Phys. Rev. Lett. 9 250 (1962).Google Scholar
11 Kim, Y.B., Hempstead, C.F., and Strand, A.R., Phys. Rev. Lett. 129 528 (1963).Google Scholar
12 We adopt the widely used procedure of defining the effective radius by (4/3)πR3 = V where V is the volume of the sample, whatever its shape. We are aware of no convincing justification for this procedure. Furthermore the fact that some films have widely different microstructures presents further problems in interpreting magnetic data. The theory may be of qualitative value for comparing films with similar microstructure and shape with the field oriented in a consistent way relative to the substrate.Google Scholar