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Characterisation of Ultrafine Microstructures Using a Position-Sensitive Atom Probe (POSAP)

Published online by Cambridge University Press:  21 February 2011

Alfred Cerezo
Affiliation:
Department of Metallurgy and Science of Materials, Oxford University, Parks Road, Oxford OXI 3PH, U.K.
Chris R. M. Grovenor
Affiliation:
Department of Metallurgy and Science of Materials, Oxford University, Parks Road, Oxford OXI 3PH, U.K.
Mark G. Hetherington
Affiliation:
Department of Metallurgy and Science of Materials, Oxford University, Parks Road, Oxford OXI 3PH, U.K.
Barbara A. Shollock
Affiliation:
Department of Metallurgy and Science of Materials, Oxford University, Parks Road, Oxford OXI 3PH, U.K.
George D. W. Smith
Affiliation:
Department of Metallurgy and Science of Materials, Oxford University, Parks Road, Oxford OXI 3PH, U.K.
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Abstract

A new development in the experimental techniques of atom probe microanalysis is described, which involves the use of a position sensitive detector system. This detector subtends a large solid angle (∼20°) at the specimen, and therefore permits the collection of ions from a substantial fraction of the whole surface area of the emitter. Progressive pulsed field evaporation leads to the construction of a three-dimensional map of the atomic chemistry of the specimen. The new instrument is ideally suited to the investigation of complex, ultrafine microstructures. Applications to the study of age-hardened aluminium alloys and Alnico permanent magnet materials are described.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

[1] Muller, E.W., Panitz, J.A. and McLane, S.B., Rev. Sci. Instrum. 39, 83 (1968).Google Scholar
[2] Panitz, J.A., Rev. Sci. Instrum. 44, 1034 (1973).Google Scholar
[3] Cerezo, A., Godfrey, T.J. and Smith, G.D.W., Rev. Sci. Instrum. 59, 862 (1988).Google Scholar
[4] Martin, C., Jelinsky, P. Lampton, M., Malina, R.F. and Anger, H.O., Rev. Sci. Instrum. 52, 1067 (1981).Google Scholar
[5] Cerezo, A., Godfrey, T.J., Grovenor, C.R.M., Hetherington, M.G., Hoyle, R.M., Jakubovics, J.P., Liddle, J.A., Smith, G.D.W. and Worrall, G.M., J. Microscopy, in press.Google Scholar
[6] Cerezo, A., Godfrey, T.J. and Smith, G.D.W., Proc. 35th International Field Emission Symposium, Oak Ridge, 1988, J. de Physique, in press.Google Scholar
[7] Liddle, J.A., Cerezo, A. and Grovenor, C.R.M., Proc. 35th International Field Emission Symposium, Oak Ridge, 1988, J. de Physique, in press.Google Scholar
[8] Liddle, J.A., Norman, A.G., Cerezo, A. and Grovenor, C.R.M., paper submitted to Appl. Phys. Lett. (November 1988).Google Scholar
[9] Polmear, I.J. and Couper, M.J., Metall. Trans. 19A, 1027 (1988).CrossRefGoogle Scholar
[10] Hetherington, M.G., Cerezo, A., Jakubovics, J.P. and Smith, G.D.W., Proc. International Conference on Magnetism, Paris 1988, in press.Google Scholar