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Capillary Instabilities in Thin, Polycrystalline Films

Published online by Cambridge University Press:  22 February 2011

David J. Srolovitz
Affiliation:
Los Alamos National Laboratory Los Alamos, NM 87545
S. A. Safran
Affiliation:
Exxon Research and Engineering Annandale, NJ 08801
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Abstract

Thin films can break up into islands only if they are perturbed by substrate-intersecting perturbations. Grain boundary grooves and vertex pits are typical defects which nucleate holes in these films. Holes which exceed a critical size - proportional to the ratio of the film thickness to the equilibrium contact angle - grow, eventually disconnecting the film.

Type
Research Article
Copyright
Copyright © Materials Research Society 1985

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References

REFERENCES

1. Nichols, F. A. and Mullins, W. W., Trans. AIME 233, 1840 (1965).Google Scholar
2. Srolovitz, D. J. and Safran, S. A., submitted to J. Appl. Phys.Google Scholar
3. Srolovitz, D. J. and Safran, S. A., to be published.Google Scholar
4. Mullins, W. W., J. Appl Phys. 28, 333 (1957).CrossRefGoogle Scholar
5. Princen, H., Colloid, J. and Int. Sci. 91,160 (1983).Google Scholar
6. Thompson, C. V., private communication.Google Scholar
7. Srolovitz, D. J. and Thompson, C. V., submitted to Thin Solid Films.Google Scholar