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Bright-Pixel Defects in Irradiated CCD Image Sensors

Published online by Cambridge University Press:  01 February 2011

William C McColgin ,
Cristian Tivarus ,
Craig C. Swanson  and
Albert J. Filo
William C McColgin
Affiliation:
William.McColgin@kodak.com, Eastman Kodak Company, Image Sensor Solutions, 1999 Lake Ave, Rochester, NY, 14650-2008, United States
Cristian Tivarus
Affiliation:
cristian.tivarus@kodak.com, Eastman Kodak Company, Image Sensor Solutions, Rochester, NY, 14650, United States
Craig C. Swanson
Affiliation:
craig.swanson@kodak.com, Eastman Kodak Company, Research Laboratories, Rochester, NY, 14650, United States
Albert J. Filo
Affiliation:
albert.filo@kodak.com, Eastman Kodak Company, Image Sensor Solutions, Rochester, NY, 14650, United States
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Abstract

We have examined environmental radiation sources for digital cameras to find the origins of bright-pixel defects known to accumulate with time. We show that beta and gamma emissions from camera parts and lenses cause image transients, but permanent damage can occur with alpha particles from the CCD cover glass. Our experiments with 14-MeV- and thermal-neutron beams confirm that cosmic rays are the primary cause of new imager bright points.

Keywords

radiation effectsSisensor
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 994: Symposium F – Semiconductor Defect Engineering–Materials, Synthetic Structures and Devices II , 2007 , 0994-F12-06
Copyright
Copyright © Materials Research Society 2007

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