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Basic Study on High-density Ferroelectric Data Storage Using Scanning Nonlinear Dielectric Microscopy

Published online by Cambridge University Press:  11 February 2011

Yoshiomi Hiranaga ,
Kenjiro Fujimoto ,
Yasuo Wagatsuma ,
Yasuo Cho ,
Atsushi Onoe ,
Kazuya Terabe  and
Kenji Kitamura
Yoshiomi Hiranaga
Affiliation:
Research Institute of Electrical Communication, Tohoku University, 2–1–1 Katahira, Aoba-ku, Sendai, 980–8577, Japan
Kenjiro Fujimoto
Affiliation:
Research Institute of Electrical Communication, Tohoku University, 2–1–1 Katahira, Aoba-ku, Sendai, 980–8577, Japan
Yasuo Wagatsuma
Affiliation:
Research Institute of Electrical Communication, Tohoku University, 2–1–1 Katahira, Aoba-ku, Sendai, 980–8577, Japan
Yasuo Cho
Affiliation:
Research Institute of Electrical Communication, Tohoku University, 2–1–1 Katahira, Aoba-ku, Sendai, 980–8577, Japan
Atsushi Onoe
Affiliation:
Pioneer Corporation, 6–1–1 Fujimi, Tsurugashima, Saitama, 350–2288, Japan
Kazuya Terabe
Affiliation:
Nanomaterials Laboratory, National Institute for Materials Science, 1–1 Namiki, Tsukuba, 305–0044, Japan
Kenji Kitamura
Affiliation:
Nanomaterials Laboratory, National Institute for Materials Science, 1–1 Namiki, Tsukuba, 305–0044, Japan
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Abstract

Scanning Nonlinear Dielectric Microscopy (SNDM) is the method for observing ferroelectric polarization distribution, and now, its resolution has become to the sub-nanometer order, which is much higher than other scanning probe microscopy (SPM) methods for the same purpose. Up to now, we have studied high-density ferroelectric data storage using this microscopy. In this study, we have conducted fundamental experiments of nano-sized inverted domain formation in LiTaO3 single, and successfully formed inverted dot array with the density of 1.5 Tbit/inch2.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 748: Symposium U – Ferroelectric Thin Films XI , 2002 , U5.5
Copyright
Copyright © Materials Research Society 2003

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References

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