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Atom-Probe Microanalysis of Metallic Nanostructured Materials

Published online by Cambridge University Press:  25 February 2011

Ross A.D. Mackenzie ,
Alfred Cerezo ,
James S. Conyers ,
Amanda K. Petford-Long ,
Sybren J. Subrandu  and
George D. W. Smith
Ross A.D. Mackenzie
Affiliation:
Department of Materials, University of Oxford, Parks Road. Oxford OX1 3PH, U.K.
Alfred Cerezo
Affiliation:
Department of Materials, University of Oxford, Parks Road. Oxford OX1 3PH, U.K.
James S. Conyers
Affiliation:
Department of Materials, University of Oxford, Parks Road. Oxford OX1 3PH, U.K.
Amanda K. Petford-Long
Affiliation:
Department of Materials, University of Oxford, Parks Road. Oxford OX1 3PH, U.K.
Sybren J. Subrandu
Affiliation:
Department of Materials, University of Oxford, Parks Road. Oxford OX1 3PH, U.K.
George D. W. Smith
Affiliation:
Department of Materials, University of Oxford, Parks Road. Oxford OX1 3PH, U.K.
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Abstract

Atom-probe techniques have been used to characterise nanostructured metallic materials prepared by thermal evaporation and by sputtering. Multilayer samples of Fe-Cr have been prepared by sputter deposition and analysed using the Oxford position-sensitive atom probe. This has made it possible to observe the quality of interfaces in the material, and also accurately determine local compositions at each layer within the multilayer stack. Preliminary experiments aimed at producing dual phase nanocrystalline films by thermal evaporator deposition are also reported.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 286: Symposium J – Nanophase and Nanocomposite Materials , 1992 , 167
Copyright
Copyright © Materials Research Society 1993

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References

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