Article contents
Assessing Ohmic Contacts
Published online by Cambridge University Press: 25 February 2011
Abstract
This paper reviews specific contact resistivity pc values obtained theoretically and experimently for a range of semiconducting materials. Techniques of obtaining pc values in terms of measurement, accuracy and reproducibility are then considered and matched to the semiconducting materials previously covered.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 1992
References
REFERENCES
- 6
- Cited by