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Accurate Determination of γ′ Solvus in Ni-Al-X Ternary Systems

Published online by Cambridge University Press:  26 February 2011

Yong Myong Hong
Affiliation:
Graduate School, Dept. of Materials Science and Engineering, Tokyo Institute of Technology, Nagatsuta.
Yoshinao Mishima
Affiliation:
Research Laboratory of Precision Machinery and Electronics, Tokyo Institute of Technology, Nagatsuta, Midori-ku, Yokohama 227, Japan
Tomoo Suzuki
Affiliation:
Research Laboratory of Precision Machinery and Electronics, Tokyo Institute of Technology, Nagatsuta, Midori-ku, Yokohama 227, Japan
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Abstract

An attempt has been made to determine the γ/γ′ phase boundaries with particular emphasis on the γ′ solvus in ternary Ni-Al-X systems with X being one of the VA or VIA transition metal elements. It is shown that the γ′ solvus in each ternary system can be obtained as a surface with respect to composition and temperature by employing differential thermal analysis (DTA) as a key experimental technique with support from energy dispersive X-ray spectroscopy combined with scanning elecron microscope(SEM-EDX). Also shown is that the DTA results often provide useful information on the phase relation in the vicinity of γ and γ′ phase fields. In the Ni-Al-V ternary system, for example, the pseudo-binary constitution between Ni3Al and Ni3V is suggested. The results presented here are systematic and consistent and therefore are reliable as compared with the previous results reported fragmentarily.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

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