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Texture Analysis of Coated Conductors by Micro-Raman and Synchrotron x-ray Diffraction

Published online by Cambridge University Press:  18 March 2011

Teresa Puig
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Anna Puig-Molina
Affiliation:
European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble, France
Narcís Mestres
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Harm Van Seijen
Affiliation:
European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble, France
Francesc Alsina
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Juan C. González
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Xavier Obradors
Affiliation:
Institut de Ciéncia de Materials de Barcelona-CSIC, Campus UAB, 08193 Bellaterra, Spain
Heinz Graafsma
Affiliation:
European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble, France
Alexander Usoskin
Affiliation:
Zentrum fuer Funktion Wekstoffe, Windausweg 2, D-37073 Goettingen, Germany
Herbert C. Freyhardt
Affiliation:
Zentrum fuer Funktion Wekstoffe, Windausweg 2, D-37073 Goettingen, Germany
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Abstract

Two novel complementary and non-destructive techniques for texture analysis of YBCO coated conductors are presented. Micro-Raman (μ-Raman) spectroscopy enables an easy analysis of the film homogeneity by determining the distribution of a- and c-oriented grains within the tape with a 1 μm spatial resolution and acquisition times of 5 min/spot. In addition, synchrotron x-ray diffraction analysis in transmission geometry and 2D detectors enables, with acquisition times of 100 ms, simultaneous observation of a- and c- crystallites and in-plane textures of substrates, buffers and superconducting layer. Thus, opening the field of this technique to in-situ analysis of epitaxial growth of coated conductors prepared by ex-situ processes. Results from these two techniques for stainless steel tapes buffered with IBAD-YSZ and coated with PLD-YBCO are analyzed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

[1] Verebelyi, D.T., Christen, DF., Feenstra, R., Cantoni, C., Goyal, A., Lee, D.F., Paranthaman, M., Arendt, P.N., DePaula, D.F., Groves, J.R., Prouteau, C., Appl. Phys. Lett. 76, 1755 (2000)CrossRefGoogle Scholar
[2] Kästner, G., Schäfer, C.. Senz, St-. Kaiser, T-, Hein, H.A., Lorenz, M., Hochmuth, H., Hesse, D., Supercond. Sic. Technol. 12, 3661 (1999)Google Scholar
[3] Usoskin, A., García-Moreno, F., Knoke, J., Sievers, S., Dzick, J., Freyhardt, H.C., Appl. Supercond. 1999, vol 1, pp 447, Inst Phys. Conf. Ser no 167 (2000)Google Scholar
[4] Cardona, M., Physica C 317–318, 30 (1999).CrossRefGoogle Scholar
[5] Dieckmann, N., Kuersten, R., Loehndorf, M., Bock, A., Physica C 245, 212 (1995)CrossRefGoogle Scholar

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Texture Analysis of Coated Conductors by Micro-Raman and Synchrotron x-ray Diffraction
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