Skip to main content Accessibility help
×
Home
Hostname: page-component-747cfc64b6-cssqh Total loading time: 0.177 Render date: 2021-06-18T04:04:56.747Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true }

Temperature induced degradation of InAlGaN multiple-quantum well UV-B LEDs

Published online by Cambridge University Press:  12 May 2015

Johannes Glaab
Affiliation:
Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
Christian Ploch
Affiliation:
Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
Rico Kelz
Affiliation:
Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
Christoph Stölmacker
Affiliation:
Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
Mickael Lapeyrade
Affiliation:
Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
Neysha Lobo Ploch
Affiliation:
Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
Jens Rass
Affiliation:
Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
Tim Kolbe
Affiliation:
Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
Sven Einfeldt
Affiliation:
Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
Frank Mehnke
Affiliation:
Technische Universität Berlin, Institut für Festkörperphysik, Hardenbergstr. 36, 10623 Berlin, Germany
Christian Kuhn
Affiliation:
Technische Universität Berlin, Institut für Festkörperphysik, Hardenbergstr. 36, 10623 Berlin, Germany
Tim Wernicke
Affiliation:
Technische Universität Berlin, Institut für Festkörperphysik, Hardenbergstr. 36, 10623 Berlin, Germany
Markus Weyers
Affiliation:
Technische Universität Berlin, Institut für Festkörperphysik, Hardenbergstr. 36, 10623 Berlin, Germany
Michael Kneissl
Affiliation:
Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany Technische Universität Berlin, Institut für Festkörperphysik, Hardenbergstr. 36, 10623 Berlin, Germany
Get access

Abstract

The reliability of InAlGaN multiple quantum well LEDs emitting around 308 nm has been investigated. The UV-B LEDs were stressed at constant current and current density, while the heat sink temperature was varied between 15°C and 80°C. The results reveal two different modes of the decrease of the optical power during aging. First, a fast reduction of the optical power within the first 100 h (mode 1) can be observed, followed by a slower degradation for operation times >100 h (mode 2). Mode 1 can be described as an initial degradation activation process which saturates after a certain time, whereas the second degradation mode can be described by a square-root time dependence of the optical power, suggesting a diffusion process to be involved. Both degradation modes are accompanied by changes of the I-V characteristic, particularly the reverse-bias leakage current and the drive voltage. Furthermore, the degradation behavior is strongly influenced by the temperature. Both, the maximum reduction of the optical power and the increase of the leakage current become stronger at higher temperatures.

Type
Articles
Copyright
Copyright © Materials Research Society 2015 

Access options

Get access to the full version of this content by using one of the access options below.

References

Endruweit, A., Johnson, M.S., and Long, A.C., Polymer Composites 27, 119 (2006)CrossRef
Krutmann, J., Morita, A., Journal of Investigative Dermatology Symposium Proceedings 4, 70 (1999)CrossRef
Schreiner, M., Martínez-Abaigar, J., Glaab, J., Jansen, M., Optik & Photonik 9 – 2, 34 (2014)CrossRef
Gong, Z., Gaevski, M., Adivarahan, V., Sun, W., Shatalov, M., Asif Khan, M., Appl. Phys. Lett. 88, 121106 (2006)CrossRef
Meneghini, M., Barbisan, D., Rodighiero, L., Meneghesso, G., Zanoni, E., Appl. Phys. Lett. 97, 143506 (2010)CrossRef
Moe, C. G., Reed, M. L., Garrett, G. A., Sampath, A. V., Alexander, T., Shen, H., Wrabeck, M., Bilenko, Y., Shatalov, M., Yang, J., Sun, W., Deng, J., Gaska, R., Appl. Phys. Lett. 96, 213512 (2010)CrossRef
Liu, J., Wong, H., Siu, S. L., Kok, C. W., Filip, V., Microelect. Reliab. 52, 1636 (2012)CrossRef
F. Mehnke, Ch. Kuhn, J. Stellmach, T. Kolbe, N. Lobo Ploch, J. Rass, M.-A. Rothe, Ch. Reich, M. Ledentsov Jr., M. Pristovsek, T. Wernicke, M. Kneissl, J. Appl. Phys. (2015), accepted for publication
J. Rass, T. Kolbe, N. Lobo Ploch, T. Wernicke, F. Mehnke, Ch. Kuhn, J. Enslin, M. Guttmann, Ch. Reich, A. Mogilatenko, J. Glaab, Ch. Stölmacker, M. Lapeyrade, S. Einfeldt, M. Weyers, M. Kneissl, Proc. of SPIE Vol. 9363, 93631K-1 (2015)
Lapeyrade, M., Muhin, A., Einfeldt, S., Zeimer, U., Mogalitenko, A., Weyers, M., Kneissl, M., Semicond. Sci. Technol. 28, 125015 (2013)CrossRef
Sawyer, S., Rumyantsev, S. L., Shur, M. S., Sol. St. Elect. 52, 968 (2008)CrossRef
Orita, K., Takigawa, S., Yuri, M., Tanaka, T., Meneghini, M., Trivellin, N., Trevisanello, L.-R., Zanoni, E., Meneghesso, G., Proc. Of IEEE Int. Reliability Physics Symposium 2009, 736 (2009)
Meneghini, M., Trevisanello, L., Zehnder, U., Meneghesso, G., Zanoni, E., Phys. Stat. Sol. (c) 5, 2250 (2008)CrossRef
Moon, S.-M., Kwak, J. S., Kor, J.. Phys. Soc. 55, 1128 (2009)
Moseley, M., Allerman, A., Crawford, M. H., Wierer, J. Jr., Smith, M. L., Armstrong, M., J. Appl. Phys. 117, 095301 (2015)CrossRef
Shan, Q., Meyaard, D. S., Dai, Q., Cho, J., Schubert, E. F., Son, J. K., Sone, Ch., Appl. Phys. Lett. 99, 253506 (2011)CrossRef
Pinos, A., Marcinkevicius, S., Yang, J., Gaska, R., Shatalov, M., Shur, M.S., J. Appl. Phys. 108, 093113 (2010)CrossRef
Meneghini, M., Trivellin, N., Trevisanello, L., Lunev, A., Yang, J., Bilenko, Y., Sun, W., Shatalov, M., Gaska, R., Zanoni, E., Meneghesso, G., Proc. Of IEEE Int. Reliability Physics Symposium 2008, 441 (2008)

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Temperature induced degradation of InAlGaN multiple-quantum well UV-B LEDs
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Temperature induced degradation of InAlGaN multiple-quantum well UV-B LEDs
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Temperature induced degradation of InAlGaN multiple-quantum well UV-B LEDs
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *